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X-RAY DIFFRACTION
Materials and Methods page
4H1G
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 277.0
    Details 0.1 M Hepes, 14% PEG 4000, 75 mM NaCl, 5% ethylene glycol, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.46 α = 90
    b = 74.93 β = 96.44
    c = 98.67 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-11-21
     
    Diffraction Radiation
    Monochromator Double crystal cryo-cooled Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1.0332
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.15
    Resolution(Low) 19.9
    Number Reflections(Observed) 38614
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.081
    B(Isotropic) From Wilson Plot 33.527
     
    High Resolution Shell Details
    Resolution(High) 2.15
    Resolution(Low) 2.5
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.337
    Mean I Over Sigma(Observed) 3.83
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.15
    Resolution(Low) 19.896
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 38614
    Number of Reflections(Observed) 38611
    Number of Reflections(R-Free) 1931
    Percent Reflections(Observed) 98.95
    R-Factor(Observed) 0.1713
    R-Work 0.1692
    R-Free 0.2109
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 30.7075
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.15
    Shell Resolution(Low) 2.2037
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.2132
    R-Factor(R-Free) 0.2714
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2037
    Shell Resolution(Low) 2.2632
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2907
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2632
    Shell Resolution(Low) 2.3297
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.1993
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3297
    Shell Resolution(Low) 2.4048
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4048
    Shell Resolution(Low) 2.4906
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1845
    R-Factor(R-Free) 0.2363
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4906
    Shell Resolution(Low) 2.5901
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.2598
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5901
    Shell Resolution(Low) 2.7077
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1794
    R-Factor(R-Free) 0.2437
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7077
    Shell Resolution(Low) 2.8501
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.1926
    R-Factor(R-Free) 0.2527
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8501
    Shell Resolution(Low) 3.0281
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.187
    R-Factor(R-Free) 0.2307
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0281
    Shell Resolution(Low) 3.2609
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2609
    Shell Resolution(Low) 3.5874
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1631
    R-Factor(R-Free) 0.2298
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5874
    Shell Resolution(Low) 4.1025
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.1612
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1025
    Shell Resolution(Low) 5.1538
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.1304
    R-Factor(R-Free) 0.1382
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1538
    Shell Resolution(Low) 19.8965
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.1818
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.687
    f_plane_restr 0.004
    f_chiral_restr 0.06
    f_angle_d 0.932
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5086
    Nucleic Acid Atoms 0
    Heterogen Atoms 77
    Solvent Atoms 390
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Locally modified Blu-Ice Gui interface to EPICS control
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser
    data reduction Xscale