X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6
Temperature 277.0
Details 0.200M (NH4)2SO4, 20.00% PEG-3350, No Buffer pH 6.0, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 49.17 α = 90
b = 49.35 β = 90
c = 156.59 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD double crystal monochromator 2009-07-31
Diffraction Radiation
Monochromator Protocol
double crystal MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.91837,0.97925,0.97910 SSRL BL9-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 28.97 99.8 0.038 -- -- 3.81 -- 51103 -- -3.0 16.915
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.64 -- 0.536 0.536 2.4 3.83 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.6 28.973 -- 0.0 -- 51033 2586 98.87 -- 0.1367 0.1357 0.1564 RANDOM + TWIN LAW
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.596 1.637 -- 147 3157 0.183 0.258 -- 88.15
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 18.6092
Anisotropic B[1][1] -2.81
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 5.06
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.25
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_1_deg 6.219
r_angle_other_deg 1.206
r_bond_refined_d 0.013
r_dihedral_angle_2_deg 30.18
r_dihedral_angle_4_deg 18.953
r_gen_planes_other 0.005
r_angle_refined_deg 1.6
r_bond_other_d 0.005
r_gen_planes_refined 0.008
r_dihedral_angle_3_deg 12.05
r_chiral_restr 0.094
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2957
Nucleic Acid Atoms 0
Heterogen Atoms 42
Solvent Atoms 442

Software

Software
Software Name Purpose
MOLPROBITY validation version: 3beta29
PDB_EXTRACT data extraction version: 3.10
SHELX phasing
SHARP phasing
XSCALE data scaling version: March 15, 2012
REFMAC refinement version: 5.7.0029
XDS data reduction
SHELXD phasing