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X-RAY DIFFRACTION
Materials and Methods page
4H0P
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.6
    Temperature 277.0
    Details 18.5% PEG2000, 100 mM sodium tartrate, 50 mM ADA, pH 6.2, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 51.37 α = 90
    b = 107.61 β = 99.83
    c = 79.11 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2009-01-31
     
    Diffraction Radiation
    Monochromator diamond(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-D
    Wavelength List 1.12712
    Site APS
    Beamline 21-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.89
    Resolution(Low) 77.95
    Number Reflections(All) 67072
    Number Reflections(Observed) 64297
    Percent Possible(Observed) 95.9
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 1.89
    Resolution(Low) 1.97
    Percent Possible(All) 89.8
    Mean I Over Sigma(Observed) 5.2
    R-Sym I(Observed) 0.309
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.894
    Resolution(Low) 38.973
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 64297
    Number of Reflections(Observed) 63974
    Number of Reflections(R-Free) 3188
    Percent Reflections(Observed) 95.04
    R-Factor(Observed) 0.1798
    R-Work 0.1777
    R-Free 0.219
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.894
    Shell Resolution(Low) 1.9219
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 1972
    R-Factor(R-Work) 0.4536
    R-Factor(R-Free) 0.4852
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9219
    Shell Resolution(Low) 1.952
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.2751
    R-Factor(R-Free) 0.3606
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.952
    Shell Resolution(Low) 1.984
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.2127
    R-Factor(R-Free) 0.2978
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.984
    Shell Resolution(Low) 2.0182
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2727
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0182
    Shell Resolution(Low) 2.0549
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.1891
    R-Factor(R-Free) 0.2624
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0549
    Shell Resolution(Low) 2.0944
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0944
    Shell Resolution(Low) 2.1371
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2391
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1371
    Shell Resolution(Low) 2.1836
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.226
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1836
    Shell Resolution(Low) 2.2344
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2365
    R-Factor(R-Work) 0.2292
    R-Factor(R-Free) 0.2457
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2344
    Shell Resolution(Low) 2.2903
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2104
    R-Factor(R-Work) 0.2338
    R-Factor(R-Free) 0.3102
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2903
    Shell Resolution(Low) 2.3522
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2115
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3522
    Shell Resolution(Low) 2.4214
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2740
    R-Factor(R-Work) 0.1756
    R-Factor(R-Free) 0.253
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4214
    Shell Resolution(Low) 2.4995
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2024
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4995
    Shell Resolution(Low) 2.5888
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2765
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2447
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5888
    Shell Resolution(Low) 2.6925
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.187
    R-Factor(R-Free) 0.2481
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6925
    Shell Resolution(Low) 2.815
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1828
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.815
    Shell Resolution(Low) 2.9633
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1857
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9633
    Shell Resolution(Low) 3.1489
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2771
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1489
    Shell Resolution(Low) 3.3919
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2737
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3919
    Shell Resolution(Low) 3.733
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1636
    R-Factor(R-Free) 0.1947
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.733
    Shell Resolution(Low) 4.2726
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.1759
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2726
    Shell Resolution(Low) 5.3808
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1356
    R-Factor(R-Free) 0.1621
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3808
    Shell Resolution(Low) 38.9814
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.1531
    R-Factor(R-Free) 0.16
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.085
    f_dihedral_angle_d 13.193
    f_angle_d 1.233
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6634
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 400
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection HKL-2000