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X-RAY DIFFRACTION
Materials and Methods page
4H0O
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.6
    Temperature 293.0
    Details 0.6 M potassium/sodium tartrate, 10 mM iron(III) chloride, 50 mM ADA, pH 6.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 98.89 α = 90
    b = 126.87 β = 90
    c = 145.56 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2008-10-17
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-G
    Wavelength List 0.97856
    Site APS
    Beamline 21-ID-G
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.4
    Resolution(Low) 45.32
    Number Reflections(All) 44735
    Number Reflections(Observed) 44735
    Percent Possible(Observed) 99.3
    Redundancy 7.7
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.44
    Percent Possible(All) 93.7
    Mean I Over Sigma(Observed) 3.0
    R-Sym I(Observed) 0.44
    Redundancy 5.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 45.319
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 44735
    Number of Reflections(Observed) 35836
    Number of Reflections(R-Free) 1601
    Percent Reflections(Observed) 99.16
    R-Factor(Observed) 0.1809
    R-Work 0.1788
    R-Free 0.2243
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.4775
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2899
    R-Factor(R-Work) 0.2219
    R-Factor(R-Free) 0.2432
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4775
    Shell Resolution(Low) 2.566
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3036
    R-Factor(R-Work) 0.2232
    R-Factor(R-Free) 0.2688
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.566
    Shell Resolution(Low) 2.6687
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3081
    R-Factor(R-Work) 0.2214
    R-Factor(R-Free) 0.2784
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6687
    Shell Resolution(Low) 2.7902
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3116
    R-Factor(R-Work) 0.2054
    R-Factor(R-Free) 0.2814
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7902
    Shell Resolution(Low) 2.9373
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3109
    R-Factor(R-Work) 0.2002
    R-Factor(R-Free) 0.2621
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9373
    Shell Resolution(Low) 3.1212
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3109
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2603
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1212
    Shell Resolution(Low) 3.3622
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3122
    R-Factor(R-Work) 0.1874
    R-Factor(R-Free) 0.2438
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3622
    Shell Resolution(Low) 3.7004
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3132
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.2067
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7004
    Shell Resolution(Low) 4.2355
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3154
    R-Factor(R-Work) 0.1558
    R-Factor(R-Free) 0.1862
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2355
    Shell Resolution(Low) 5.3349
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3182
    R-Factor(R-Work) 0.1501
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3349
    Shell Resolution(Low) 45.3269
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3295
    R-Factor(R-Work) 0.1728
    R-Factor(R-Free) 0.2354
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.055
    f_dihedral_angle_d 13.16
    f_angle_d 0.832
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5986
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 163
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection HKL-2000