X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.6
Temperature 293.0
Details 0.6 M potassium/sodium tartrate, 10 mM iron(III) chloride, 50 mM ADA, pH 6.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 98.89 α = 90
b = 126.87 β = 90
c = 145.56 γ = 90
Symmetry
Space Group I 2 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2008-10-17
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.97856 APS 21-ID-G

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 45.32 99.3 -- 0.138 -- 7.7 44735 44735 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.4 2.44 93.7 -- 0.44 3.0 5.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.4 45.319 -- 1.34 44735 35836 1601 99.16 -- 0.1809 0.1788 0.2243 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.4 2.4775 -- 135 2899 0.2219 0.2432 -- 94.0
X Ray Diffraction 2.4775 2.566 -- 142 3036 0.2232 0.2688 -- 98.0
X Ray Diffraction 2.566 2.6687 -- 144 3081 0.2214 0.2784 -- 99.0
X Ray Diffraction 2.6687 2.7902 -- 147 3116 0.2054 0.2814 -- 100.0
X Ray Diffraction 2.7902 2.9373 -- 145 3109 0.2002 0.2621 -- 100.0
X Ray Diffraction 2.9373 3.1212 -- 145 3109 0.1981 0.2603 -- 100.0
X Ray Diffraction 3.1212 3.3622 -- 147 3122 0.1874 0.2438 -- 100.0
X Ray Diffraction 3.3622 3.7004 -- 146 3132 0.1657 0.2067 -- 100.0
X Ray Diffraction 3.7004 4.2355 -- 147 3154 0.1558 0.1862 -- 100.0
X Ray Diffraction 4.2355 5.3349 -- 150 3182 0.1501 0.1713 -- 100.0
X Ray Diffraction 5.3349 45.3269 -- 153 3295 0.1728 0.2354 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.055
f_dihedral_angle_d 13.16
f_angle_d 0.832
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5986
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 163

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASER model building
HKL-2000 data collection