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X-RAY DIFFRACTION
Materials and Methods page
4H0L
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 293.0
    Details pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 159.13 α = 90
    b = 159.13 β = 90
    c = 362.25 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2006-07-07
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.25
    Resolution(Low) 48.45
    Number Reflections(Observed) 43609
    B(Isotropic) From Wilson Plot 96.84
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.25
    Resolution(Low) 48.447
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 43485
    Number of Reflections(Observed) 43451
    Number of Reflections(R-Free) 2185
    Percent Reflections(Observed) 99.53
    R-Factor(Observed) 0.22
    R-Work 0.2185
    R-Free 0.2473
     
    Temperature Factor Modeling
    Mean Isotropic B Value 106.065
    Anisotropic B[1][1] 0.02
    Anisotropic B[1][2] 0.02
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.02
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.07
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2469
    Shell Resolution(Low) 3.3174
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2483
    R-Factor(R-Work) 0.2663
    R-Factor(R-Free) 0.2809
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3174
    Shell Resolution(Low) 3.3946
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.2535
    R-Factor(R-Free) 0.3053
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3946
    Shell Resolution(Low) 3.4795
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2538
    R-Factor(R-Work) 0.2552
    R-Factor(R-Free) 0.2677
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4795
    Shell Resolution(Low) 3.5735
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2519
    R-Factor(R-Work) 0.2212
    R-Factor(R-Free) 0.2894
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5735
    Shell Resolution(Low) 3.6786
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.2075
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6786
    Shell Resolution(Low) 3.7973
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.2064
    R-Factor(R-Free) 0.2647
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7973
    Shell Resolution(Low) 3.933
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2549
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.2557
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.933
    Shell Resolution(Low) 4.0904
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2567
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2467
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0904
    Shell Resolution(Low) 4.2764
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.2211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2764
    Shell Resolution(Low) 4.5017
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.2001
    R-Factor(R-Free) 0.2186
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5017
    Shell Resolution(Low) 4.7836
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.1957
    R-Factor(R-Free) 0.2351
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7836
    Shell Resolution(Low) 5.1525
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.1964
    R-Factor(R-Free) 0.2109
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1525
    Shell Resolution(Low) 5.6703
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.205
    R-Factor(R-Free) 0.253
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6703
    Shell Resolution(Low) 6.4892
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2386
    R-Factor(R-Free) 0.226
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4892
    Shell Resolution(Low) 8.1693
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.2132
    R-Factor(R-Free) 0.2468
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.1693
    Shell Resolution(Low) 48.4523
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2757
    R-Factor(R-Work) 0.2525
    R-Factor(R-Free) 0.2753
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.192
    f_dihedral_angle_d 19.586
    f_angle_d 1.515
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7386
    Nucleic Acid Atoms 0
    Heterogen Atoms 601
    Solvent Atoms 6
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement REFMAC version: 5.7.0029