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X-RAY DIFFRACTION
Materials and Methods page
4H0E
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 4.2
    Temperature 298.0
    Details 25% PEG 8000, pH 4.2, VAPOR DIFFUSION, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 137.8 α = 90
    b = 42.62 β = 114.92
    c = 67.44 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PILATUS
    Type PSI PILATUS 6M
    Collection Date 2012-08-18
     
    Diffraction Radiation
    Monochromator Bartels
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.00
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.97
    Resolution(Low) 40.34
    Number Reflections(All) 25314
    Number Reflections(Observed) 24656
    Percent Possible(Observed) 100.0
     
    High Resolution Shell Details
    Resolution(High) 1.973
    Resolution(Low) 2.08
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.973
    Resolution(Low) 40.339
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 24593
    Number of Reflections(Observed) 23894
    Number of Reflections(R-Free) 1212
    Percent Reflections(Observed) 94.23
    R-Factor(All) 0.2209
    R-Factor(Observed) 0.2209
    R-Work 0.2192
    R-Free 0.2526
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 10.9461
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 10.2573
    Anisotropic B[2][2] -6.0025
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.9437
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.973
    Shell Resolution(Low) 2.052
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2342
    R-Factor(R-Work) 0.2421
    R-Factor(R-Free) 0.2927
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.052
    Shell Resolution(Low) 2.1454
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2371
    R-Factor(R-Work) 0.2261
    R-Factor(R-Free) 0.2787
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1454
    Shell Resolution(Low) 2.2585
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2453
    R-Factor(R-Work) 0.2222
    R-Factor(R-Free) 0.287
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2585
    Shell Resolution(Low) 2.4
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2470
    R-Factor(R-Work) 0.23
    R-Factor(R-Free) 0.2644
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.5852
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2538
    R-Factor(R-Work) 0.241
    R-Factor(R-Free) 0.3105
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5852
    Shell Resolution(Low) 2.8453
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.2427
    R-Factor(R-Free) 0.3161
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8453
    Shell Resolution(Low) 3.2569
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.2401
    R-Factor(R-Free) 0.2817
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2569
    Shell Resolution(Low) 4.1027
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.2032
    R-Factor(R-Free) 0.205
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1027
    Shell Resolution(Low) 40.3471
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2728
    R-Factor(R-Work) 0.2021
    R-Factor(R-Free) 0.2207
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.063
    f_dihedral_angle_d 23.95
    f_angle_d 1.345
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1181
    Nucleic Acid Atoms 855
    Heterogen Atoms 13
    Solvent Atoms 156
     
     
  •   Software and Computing Hide
    Computing
    Data Collection PXIII program
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection PXIII version: program