X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 298.0
Details 100mM TRIS, 1.8M Ammonium Sulfate, 20mM 2-mercaptoethanol, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 96.19 α = 90
b = 96.19 β = 90
c = 83.28 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 173
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 345 mm plate -- 2011-10-26
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 19.6 94.4 -- -- -- 7.9 9141 8628 1.35 1.35 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.0 3.1 97.6 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.005 19.632 -- 1.34 10060 8628 869 94.39 -- 0.2216 0.215 0.2802 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.005 3.1925 -- 139 1278 0.3191 0.4121 -- 95.0
X Ray Diffraction 3.1925 3.4378 -- 156 1357 0.238 0.3015 -- 100.0
X Ray Diffraction 3.4378 3.7815 -- 107 950 0.316 0.4589 -- 72.0
X Ray Diffraction 3.7815 4.3236 -- 153 1358 0.2146 0.2704 -- 99.0
X Ray Diffraction 4.3236 5.4282 -- 158 1369 0.1608 0.2207 -- 100.0
X Ray Diffraction 5.4282 19.6322 -- 156 1447 0.1854 0.2251 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -5.3941
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -5.3941
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 10.7883
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.075
f_dihedral_angle_d 20.137
f_angle_d 1.212
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2125
Nucleic Acid Atoms 0
Heterogen Atoms 10
Solvent Atoms 0

Software

Computing
Computing Package Purpose
MAR345dtb Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
Phaser model building
MAR345dtb data collection