POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4GYF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 293.0
    Details 2.5 M SODIUM CHLORIDE, 0.1M IMIDAZOLE,0.5mM Zinc chloride, 100 mM histidinol phosphate , pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 85.66 α = 90
    b = 86.68 β = 90
    c = 45.08 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2011-11-10
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.65
    Resolution(Low) 42.83
    Number Reflections(All) 40890
    Number Reflections(Observed) 40890
    Percent Possible(Observed) 98.75
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.647
    Resolution(Low) 42.831
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 40890
    Number of Reflections(Observed) 40890
    Number of Reflections(R-Free) 2051
    Percent Reflections(Observed) 98.75
    R-Factor(All) 0.1612
    R-Factor(Observed) 0.1612
    R-Work 0.1599
    R-Free 0.1856
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.647
    Shell Resolution(Low) 1.6854
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2451
    R-Factor(R-Work) 0.2213
    R-Factor(R-Free) 0.2548
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6854
    Shell Resolution(Low) 1.7275
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.2116
    R-Factor(R-Free) 0.2367
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7275
    Shell Resolution(Low) 1.7742
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.1993
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7742
    Shell Resolution(Low) 1.8264
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8264
    Shell Resolution(Low) 1.8854
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1626
    R-Factor(R-Free) 0.2005
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8854
    Shell Resolution(Low) 1.9528
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2583
    R-Factor(R-Work) 0.1582
    R-Factor(R-Free) 0.2019
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9528
    Shell Resolution(Low) 2.031
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.1485
    R-Factor(R-Free) 0.1752
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.031
    Shell Resolution(Low) 2.1234
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.1433
    R-Factor(R-Free) 0.1702
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1234
    Shell Resolution(Low) 2.2353
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.1416
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2353
    Shell Resolution(Low) 2.3754
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.149
    R-Factor(R-Free) 0.1723
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3754
    Shell Resolution(Low) 2.5587
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.1781
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5587
    Shell Resolution(Low) 2.8162
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.1702
    R-Factor(R-Free) 0.1934
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8162
    Shell Resolution(Low) 3.2236
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.1655
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2236
    Shell Resolution(Low) 4.0609
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.1419
    R-Factor(R-Free) 0.163
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0609
    Shell Resolution(Low) 42.845
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1591
    R-Factor(R-Free) 0.1734
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 16.135
    f_angle_d 1.02
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2173
    Nucleic Acid Atoms 0
    Heterogen Atoms 57
    Solvent Atoms 229
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution balbes
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building balbes
    data collection CBASS