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X-RAY DIFFRACTION
Materials and Methods page
4GY5
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 291.0
    Details 20% PEG 3350, 200mM Ammonium Tartrate, 100mM Bis-Tris, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 145.94 α = 90
    b = 145.94 β = 90
    c = 125.9 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type ADSC QUANTUM 315
    Collection Date 2012-02-24
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97927
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.96
    Resolution(Low) 50
    Number Reflections(All) 27861
    Number Reflections(Observed) 27861
    Percent Possible(Observed) 100.0
    B(Isotropic) From Wilson Plot 82.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.956
    Resolution(Low) 45.377
    Cut-off Sigma(F) 0.16
    Number of Reflections(all) 27861
    Number of Reflections(Observed) 27861
    Number of Reflections(R-Free) 1401
    Percent Reflections(Observed) 95.91
    R-Factor(All) 0.2549
    R-Factor(Observed) 0.2565
    R-Work 0.2549
    R-Free 0.2876
     
    Temperature Factor Modeling
    Mean Isotropic B Value 97.4127
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9556
    Shell Resolution(Low) 3.0612
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2347
    R-Factor(R-Work) 0.3599
    R-Factor(R-Free) 0.3813
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0612
    Shell Resolution(Low) 3.1837
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2423
    R-Factor(R-Work) 0.3257
    R-Factor(R-Free) 0.3539
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1837
    Shell Resolution(Low) 3.3286
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2547
    R-Factor(R-Work) 0.2969
    R-Factor(R-Free) 0.3667
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3286
    Shell Resolution(Low) 3.504
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.29
    R-Factor(R-Free) 0.3348
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.504
    Shell Resolution(Low) 3.7235
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.2639
    R-Factor(R-Free) 0.3257
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7235
    Shell Resolution(Low) 4.0108
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.252
    R-Factor(R-Free) 0.3099
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0108
    Shell Resolution(Low) 4.4141
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.2208
    R-Factor(R-Free) 0.2379
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4141
    Shell Resolution(Low) 5.0521
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2751
    R-Factor(R-Work) 0.202
    R-Factor(R-Free) 0.2378
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0521
    Shell Resolution(Low) 6.3624
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.2308
    R-Factor(R-Free) 0.2657
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3624
    Shell Resolution(Low) 45.3826
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2931
    R-Factor(R-Work) 0.2605
    R-Factor(R-Free) 0.2753
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.46
    f_plane_restr 0.009
    f_chiral_restr 0.054
    f_angle_d 0.701
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6121
    Nucleic Acid Atoms 0
    Heterogen Atoms 7
    Solvent Atoms 10
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.1_353)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_353)
    model building PHASER
    data collection HKL-2000