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X-RAY DIFFRACTION
Materials and Methods page
4GXM
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 277.0
    Details 0.2M MgCl2, 0.1M Hepes, 35%PEG400, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 141.12 α = 90
    b = 141.12 β = 90
    c = 42.92 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2012-04-26
     
    Diffraction Radiation
    Monochromator si (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X26C
    Wavelength List 0.9795
    Site NSLS
    Beamline X26C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.35
    Resolution(Low) 50
    Number Reflections(Observed) 87102
    Percent Possible(Observed) 99.9
    B(Isotropic) From Wilson Plot 13.08
    Redundancy 16.5
     
    High Resolution Shell Details
    Resolution(High) 1.36
    Resolution(Low) 1.38
    Percent Possible(All) 56.4
    Mean I Over Sigma(Observed) 3.68
    R-Sym I(Observed) 0.394
    Redundancy 6.5
    Number Unique Reflections(All) 2611
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.362
    Resolution(Low) 34.227
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 87025
    Number of Reflections(R-Free) 8695
    Percent Reflections(Observed) 93.75
    R-Factor(Observed) 0.1108
    R-Work 0.1079
    R-Free 0.1365
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3622
    Shell Resolution(Low) 1.3776
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 1693
    R-Factor(R-Work) 0.1226
    R-Factor(R-Free) 0.1799
    Percent Reflections(Observed) 61.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3776
    Shell Resolution(Low) 1.3938
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 1786
    R-Factor(R-Work) 0.1098
    R-Factor(R-Free) 0.1702
    Percent Reflections(Observed) 66.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3938
    Shell Resolution(Low) 1.4108
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 1915
    R-Factor(R-Work) 0.097
    R-Factor(R-Free) 0.1491
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4108
    Shell Resolution(Low) 1.4287
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 2008
    R-Factor(R-Work) 0.0968
    R-Factor(R-Free) 0.155
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4287
    Shell Resolution(Low) 1.4475
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 2146
    R-Factor(R-Work) 0.0946
    R-Factor(R-Free) 0.1443
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4475
    Shell Resolution(Low) 1.4673
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 2249
    R-Factor(R-Work) 0.0928
    R-Factor(R-Free) 0.132
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4673
    Shell Resolution(Low) 1.4883
    Number of Reflections(R-Free) 268
    Number of Reflections(R-Work) 2442
    R-Factor(R-Work) 0.0917
    R-Factor(R-Free) 0.1298
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4883
    Shell Resolution(Low) 1.5105
    Number of Reflections(R-Free) 289
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.0912
    R-Factor(R-Free) 0.138
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5105
    Shell Resolution(Low) 1.5341
    Number of Reflections(R-Free) 305
    Number of Reflections(R-Work) 2752
    R-Factor(R-Work) 0.0863
    R-Factor(R-Free) 0.1402
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5341
    Shell Resolution(Low) 1.5593
    Number of Reflections(R-Free) 302
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.0805
    R-Factor(R-Free) 0.1282
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5593
    Shell Resolution(Low) 1.5861
    Number of Reflections(R-Free) 311
    Number of Reflections(R-Work) 2795
    R-Factor(R-Work) 0.0783
    R-Factor(R-Free) 0.1283
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5861
    Shell Resolution(Low) 1.615
    Number of Reflections(R-Free) 300
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.078
    R-Factor(R-Free) 0.1249
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.615
    Shell Resolution(Low) 1.646
    Number of Reflections(R-Free) 309
    Number of Reflections(R-Work) 2779
    R-Factor(R-Work) 0.0808
    R-Factor(R-Free) 0.121
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.646
    Shell Resolution(Low) 1.6796
    Number of Reflections(R-Free) 304
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.0811
    R-Factor(R-Free) 0.1175
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6796
    Shell Resolution(Low) 1.7162
    Number of Reflections(R-Free) 308
    Number of Reflections(R-Work) 2766
    R-Factor(R-Work) 0.084
    R-Factor(R-Free) 0.1174
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7162
    Shell Resolution(Low) 1.7561
    Number of Reflections(R-Free) 306
    Number of Reflections(R-Work) 2751
    R-Factor(R-Work) 0.089
    R-Factor(R-Free) 0.119
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7561
    Shell Resolution(Low) 1.8
    Number of Reflections(R-Free) 311
    Number of Reflections(R-Work) 2800
    R-Factor(R-Work) 0.0918
    R-Factor(R-Free) 0.1369
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.8487
    Number of Reflections(R-Free) 304
    Number of Reflections(R-Work) 2742
    R-Factor(R-Work) 0.0942
    R-Factor(R-Free) 0.1198
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8487
    Shell Resolution(Low) 1.9031
    Number of Reflections(R-Free) 309
    Number of Reflections(R-Work) 2784
    R-Factor(R-Work) 0.099
    R-Factor(R-Free) 0.1326
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9031
    Shell Resolution(Low) 1.9645
    Number of Reflections(R-Free) 310
    Number of Reflections(R-Work) 2793
    R-Factor(R-Work) 0.1018
    R-Factor(R-Free) 0.1391
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9645
    Shell Resolution(Low) 2.0347
    Number of Reflections(R-Free) 307
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.0987
    R-Factor(R-Free) 0.1238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0347
    Shell Resolution(Low) 2.1161
    Number of Reflections(R-Free) 311
    Number of Reflections(R-Work) 2791
    R-Factor(R-Work) 0.0965
    R-Factor(R-Free) 0.1242
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1161
    Shell Resolution(Low) 2.2124
    Number of Reflections(R-Free) 309
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.0949
    R-Factor(R-Free) 0.1191
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2124
    Shell Resolution(Low) 2.3291
    Number of Reflections(R-Free) 310
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.0956
    R-Factor(R-Free) 0.1301
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3291
    Shell Resolution(Low) 2.4749
    Number of Reflections(R-Free) 313
    Number of Reflections(R-Work) 2801
    R-Factor(R-Work) 0.1019
    R-Factor(R-Free) 0.1316
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4749
    Shell Resolution(Low) 2.666
    Number of Reflections(R-Free) 314
    Number of Reflections(R-Work) 2830
    R-Factor(R-Work) 0.1088
    R-Factor(R-Free) 0.1332
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.666
    Shell Resolution(Low) 2.9341
    Number of Reflections(R-Free) 313
    Number of Reflections(R-Work) 2829
    R-Factor(R-Work) 0.12
    R-Factor(R-Free) 0.1283
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9341
    Shell Resolution(Low) 3.3584
    Number of Reflections(R-Free) 318
    Number of Reflections(R-Work) 2852
    R-Factor(R-Work) 0.1259
    R-Factor(R-Free) 0.1535
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3584
    Shell Resolution(Low) 4.23
    Number of Reflections(R-Free) 321
    Number of Reflections(R-Work) 2898
    R-Factor(R-Work) 0.1174
    R-Factor(R-Free) 0.1396
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.23
    Shell Resolution(Low) 34.2374
    Number of Reflections(R-Free) 336
    Number of Reflections(R-Work) 3015
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.1692
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.112
    f_dihedral_angle_d 17.597
    f_angle_d 1.442
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3172
    Nucleic Acid Atoms 0
    Heterogen Atoms 100
    Solvent Atoms 633
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection CBASS