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X-RAY DIFFRACTION
Materials and Methods page
4GXK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 7.5
    Temperature 291.0
    Details 50mM Imidazole, 350mM sodium acetate, 17% Peg3350, pH 7.5, VAPOR DIFFUSION, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.86 α = 90
    b = 78.79 β = 112.65
    c = 55.15 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 92
    Details mirrors
    Collection Date 2011-05-17
     
    Diffraction Radiation
    Monochromator mirrors Varimax HF
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2
    Resolution(Low) 50
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.067
    B(Isotropic) From Wilson Plot 31.97
    Redundancy 4.8
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.07
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.411
    Mean I Over Sigma(Observed) 2.39
    Redundancy 2.9
    Number Unique Reflections(All) 2927
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.998
    Resolution(Low) 22.888
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 27692
    Number of Reflections(Observed) 27692
    Number of Reflections(R-Free) 1369
    Percent Reflections(Observed) 94.08
    R-Factor(All) 0.2222
    R-Factor(Observed) 0.2222
    R-Work 0.2194
    R-Free 0.2779
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.9025
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.4272
    Anisotropic B[2][2] 1.0471
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.9496
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9979
    Shell Resolution(Low) 2.0693
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2504
    R-Factor(R-Work) 0.2362
    R-Factor(R-Free) 0.313
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0693
    Shell Resolution(Low) 2.1521
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.2301
    R-Factor(R-Free) 0.2929
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1521
    Shell Resolution(Low) 2.2499
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.2257
    R-Factor(R-Free) 0.3054
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2499
    Shell Resolution(Low) 2.3685
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.2409
    R-Factor(R-Free) 0.3149
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3685
    Shell Resolution(Low) 2.5167
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2530
    R-Factor(R-Work) 0.2492
    R-Factor(R-Free) 0.354
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5167
    Shell Resolution(Low) 2.7107
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2524
    R-Factor(R-Work) 0.2542
    R-Factor(R-Free) 0.324
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7107
    Shell Resolution(Low) 2.983
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2536
    R-Factor(R-Work) 0.2516
    R-Factor(R-Free) 0.3187
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.983
    Shell Resolution(Low) 3.4134
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.2234
    R-Factor(R-Free) 0.2601
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4134
    Shell Resolution(Low) 4.2959
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2793
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2927
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2959
    Shell Resolution(Low) 22.889
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2829
    R-Factor(R-Work) 0.2087
    R-Factor(R-Free) 0.216
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.07
    f_dihedral_angle_d 21.962
    f_angle_d 1.192
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2522
    Nucleic Acid Atoms 632
    Heterogen Atoms 39
    Solvent Atoms 188
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building CNS
    data collection StructureStudio