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X-RAY DIFFRACTION
Materials and Methods page
4GXI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 8
    Temperature 291.0
    Details 50mM imidazole, 350mM Sodium Acetate, 18% Peg3350, pH 8.0, VAPOR DIFFUSION, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.8 α = 90
    b = 79.26 β = 105.62
    c = 54.37 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 92
    Details mirrors
    Collection Date 2011-04-21
     
    Diffraction Radiation
    Monochromator mirrors Varimax HF
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.95
    Resolution(Low) 50
    Percent Possible(Observed) 98.3
    R Merge I(Observed) 0.114
    B(Isotropic) From Wilson Plot 22.2
    Redundancy 4.7
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.02
    Percent Possible(All) 86.3
    R Merge I(Observed) 0.5
    Mean I Over Sigma(Observed) 2.29
    Redundancy 3.4
    Number Unique Reflections(All) 2802
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.949
    Resolution(Low) 22.097
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 29554
    Number of Reflections(Observed) 29554
    Number of Reflections(R-Free) 2930
    Percent Reflections(Observed) 90.29
    R-Factor(All) 0.2083
    R-Factor(Observed) 0.2083
    R-Work 0.2026
    R-Free 0.2589
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model restrained
    Mean Isotropic B Value 22.2
    Anisotropic B[1][1] -2.3841
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.6468
    Anisotropic B[2][2] 0.787
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.5971
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9488
    Shell Resolution(Low) 1.9808
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 884
    R-Factor(R-Work) 0.2447
    R-Factor(R-Free) 0.2835
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9808
    Shell Resolution(Low) 2.0149
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1118
    R-Factor(R-Work) 0.214
    R-Factor(R-Free) 0.2804
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0149
    Shell Resolution(Low) 2.0515
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1279
    R-Factor(R-Work) 0.2133
    R-Factor(R-Free) 0.3007
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0515
    Shell Resolution(Low) 2.091
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1378
    R-Factor(R-Work) 0.2125
    R-Factor(R-Free) 0.2689
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.091
    Shell Resolution(Low) 2.1336
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1367
    R-Factor(R-Work) 0.1978
    R-Factor(R-Free) 0.304
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1336
    Shell Resolution(Low) 2.18
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1371
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2566
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.18
    Shell Resolution(Low) 2.2306
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1327
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.2885
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2306
    Shell Resolution(Low) 2.2863
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1352
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2863
    Shell Resolution(Low) 2.3481
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1262
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.3061
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3481
    Shell Resolution(Low) 2.4171
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1245
    R-Factor(R-Work) 0.2103
    R-Factor(R-Free) 0.304
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4171
    Shell Resolution(Low) 2.495
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1189
    R-Factor(R-Work) 0.2399
    R-Factor(R-Free) 0.2827
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.495
    Shell Resolution(Low) 2.5841
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1194
    R-Factor(R-Work) 0.2369
    R-Factor(R-Free) 0.2876
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5841
    Shell Resolution(Low) 2.6874
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1147
    R-Factor(R-Work) 0.2457
    R-Factor(R-Free) 0.3604
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6874
    Shell Resolution(Low) 2.8094
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1148
    R-Factor(R-Work) 0.2457
    R-Factor(R-Free) 0.3136
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8094
    Shell Resolution(Low) 2.9572
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 1129
    R-Factor(R-Work) 0.2416
    R-Factor(R-Free) 0.3016
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9572
    Shell Resolution(Low) 3.142
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 1285
    R-Factor(R-Work) 0.2227
    R-Factor(R-Free) 0.3404
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.142
    Shell Resolution(Low) 3.3838
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1409
    R-Factor(R-Work) 0.2083
    R-Factor(R-Free) 0.2395
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3838
    Shell Resolution(Low) 3.7229
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 1395
    R-Factor(R-Work) 0.2089
    R-Factor(R-Free) 0.2589
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7229
    Shell Resolution(Low) 4.2583
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1331
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.1871
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2583
    Shell Resolution(Low) 5.3524
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1374
    R-Factor(R-Work) 0.1614
    R-Factor(R-Free) 0.2028
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3524
    Shell Resolution(Low) 22.0984
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1440
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2125
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 20.555
    f_angle_d 1.123
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2620
    Nucleic Acid Atoms 632
    Heterogen Atoms 4
    Solvent Atoms 360
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building CNS
    data collection StructureStudio