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X-RAY DIFFRACTION
Materials and Methods page
4GWE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 277.0
    Details 0.1M hepes, 0.2M MgCl2, 35%peg400, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 140.78 α = 90
    b = 140.78 β = 90
    c = 42.76 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2012-04-26
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X26C
    Wavelength List 0.9795
    Site NSLS
    Beamline X26C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.45
    Resolution(Low) 50
    Number Reflections(Observed) 70049
    Percent Possible(Observed) 90.5
    R Merge I(Observed) 0.044
    B(Isotropic) From Wilson Plot 11.32
    Redundancy 12.8
     
    High Resolution Shell Details
    Resolution(High) 1.45
    Resolution(Low) 1.48
    Percent Possible(All) 52.6
    R Merge I(Observed) 0.18
    Mean I Over Sigma(Observed) 10.0
    Redundancy 11.7
    Number Unique Reflections(All) 2020
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.45
    Resolution(Low) 28.156
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 70001
    Number of Reflections(R-Free) 7038
    Percent Reflections(Observed) 90.8
    R-Factor(Observed) 0.1178
    R-Work 0.1148
    R-Free 0.1449
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.45
    Shell Resolution(Low) 1.4628
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1193
    R-Factor(R-Work) 0.0818
    R-Factor(R-Free) 0.1481
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4628
    Shell Resolution(Low) 1.48
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1289
    R-Factor(R-Work) 0.0844
    R-Factor(R-Free) 0.142
    Percent Reflections(Observed) 57.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.48
    Shell Resolution(Low) 1.4981
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1409
    R-Factor(R-Work) 0.0853
    R-Factor(R-Free) 0.1475
    Percent Reflections(Observed) 62.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4981
    Shell Resolution(Low) 1.517
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 1600
    R-Factor(R-Work) 0.0813
    R-Factor(R-Free) 0.1395
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.517
    Shell Resolution(Low) 1.537
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 1921
    R-Factor(R-Work) 0.0827
    R-Factor(R-Free) 0.139
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.537
    Shell Resolution(Low) 1.5581
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 2056
    R-Factor(R-Work) 0.0796
    R-Factor(R-Free) 0.1517
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5581
    Shell Resolution(Low) 1.5803
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2063
    R-Factor(R-Work) 0.0861
    R-Factor(R-Free) 0.1334
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5803
    Shell Resolution(Low) 1.6039
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2058
    R-Factor(R-Work) 0.0839
    R-Factor(R-Free) 0.1378
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6039
    Shell Resolution(Low) 1.629
    Number of Reflections(R-Free) 238
    Number of Reflections(R-Work) 2125
    R-Factor(R-Work) 0.0855
    R-Factor(R-Free) 0.1508
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.629
    Shell Resolution(Low) 1.6557
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 2101
    R-Factor(R-Work) 0.0823
    R-Factor(R-Free) 0.1551
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6557
    Shell Resolution(Low) 1.6842
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 2130
    R-Factor(R-Work) 0.0885
    R-Factor(R-Free) 0.1471
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6842
    Shell Resolution(Low) 1.7148
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 2183
    R-Factor(R-Work) 0.0886
    R-Factor(R-Free) 0.1305
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7148
    Shell Resolution(Low) 1.7478
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 2153
    R-Factor(R-Work) 0.0884
    R-Factor(R-Free) 0.1281
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7478
    Shell Resolution(Low) 1.7835
    Number of Reflections(R-Free) 247
    Number of Reflections(R-Work) 2182
    R-Factor(R-Work) 0.0965
    R-Factor(R-Free) 0.1411
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7835
    Shell Resolution(Low) 1.8222
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 2199
    R-Factor(R-Work) 0.0966
    R-Factor(R-Free) 0.1493
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8222
    Shell Resolution(Low) 1.8646
    Number of Reflections(R-Free) 247
    Number of Reflections(R-Work) 2216
    R-Factor(R-Work) 0.0991
    R-Factor(R-Free) 0.1374
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8646
    Shell Resolution(Low) 1.9112
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 2222
    R-Factor(R-Work) 0.1025
    R-Factor(R-Free) 0.1491
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9112
    Shell Resolution(Low) 1.9629
    Number of Reflections(R-Free) 247
    Number of Reflections(R-Work) 2230
    R-Factor(R-Work) 0.107
    R-Factor(R-Free) 0.1312
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9629
    Shell Resolution(Low) 2.0207
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 2217
    R-Factor(R-Work) 0.1062
    R-Factor(R-Free) 0.1305
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0207
    Shell Resolution(Low) 2.0859
    Number of Reflections(R-Free) 249
    Number of Reflections(R-Work) 2265
    R-Factor(R-Work) 0.1033
    R-Factor(R-Free) 0.1438
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0859
    Shell Resolution(Low) 2.1604
    Number of Reflections(R-Free) 250
    Number of Reflections(R-Work) 2234
    R-Factor(R-Work) 0.1059
    R-Factor(R-Free) 0.1281
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1604
    Shell Resolution(Low) 2.2468
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 2244
    R-Factor(R-Work) 0.103
    R-Factor(R-Free) 0.1352
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2468
    Shell Resolution(Low) 2.3491
    Number of Reflections(R-Free) 254
    Number of Reflections(R-Work) 2291
    R-Factor(R-Work) 0.1076
    R-Factor(R-Free) 0.1368
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3491
    Shell Resolution(Low) 2.4728
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 2277
    R-Factor(R-Work) 0.11
    R-Factor(R-Free) 0.1433
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4728
    Shell Resolution(Low) 2.6277
    Number of Reflections(R-Free) 254
    Number of Reflections(R-Work) 2288
    R-Factor(R-Work) 0.1158
    R-Factor(R-Free) 0.1409
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6277
    Shell Resolution(Low) 2.8304
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 2307
    R-Factor(R-Work) 0.1193
    R-Factor(R-Free) 0.1374
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8304
    Shell Resolution(Low) 3.1149
    Number of Reflections(R-Free) 259
    Number of Reflections(R-Work) 2308
    R-Factor(R-Work) 0.1313
    R-Factor(R-Free) 0.156
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1149
    Shell Resolution(Low) 3.5648
    Number of Reflections(R-Free) 260
    Number of Reflections(R-Work) 2351
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1581
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5648
    Shell Resolution(Low) 4.4884
    Number of Reflections(R-Free) 264
    Number of Reflections(R-Work) 2370
    R-Factor(R-Work) 0.1253
    R-Factor(R-Free) 0.137
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4884
    Shell Resolution(Low) 28.1613
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 2481
    R-Factor(R-Work) 0.1664
    R-Factor(R-Free) 0.1767
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.079
    f_dihedral_angle_d 14.683
    f_angle_d 1.251
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3162
    Nucleic Acid Atoms 0
    Heterogen Atoms 65
    Solvent Atoms 590
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection CBASS