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X-RAY DIFFRACTION
Materials and Methods page
4GUU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 277.0
    Details 0.02M Citric acid, 0.03M Bis_tris propane, 10% PEG3350, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.82 α = 90
    b = 90.16 β = 104.2
    c = 87.82 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type ADSC QUANTUM 315r
    Collection Date 2011-05-13
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97906
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 39484
    Number Reflections(Observed) 37948
    Percent Possible(Observed) 89.97
    B(Isotropic) From Wilson Plot 31.68
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.302
    Resolution(Low) 36.232
    Cut-off Sigma(F) 0.11
    Number of Reflections(Observed) 37948
    Number of Reflections(R-Free) 1922
    Percent Reflections(Observed) 89.97
    R-Factor(Observed) 0.2004
    R-Work 0.1987
    R-Free 0.2313
     
    Temperature Factor Modeling
    Mean Isotropic B Value 39.2296
    Anisotropic B[1][1] -3.3588
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 9.7473
    Anisotropic B[2][2] 2.7374
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.6213
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3018
    Shell Resolution(Low) 2.3593
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2189
    R-Factor(R-Work) 0.2405
    R-Factor(R-Free) 0.2762
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3593
    Shell Resolution(Low) 2.4231
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.2263
    R-Factor(R-Free) 0.249
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4231
    Shell Resolution(Low) 2.4944
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.2178
    R-Factor(R-Free) 0.2437
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4944
    Shell Resolution(Low) 2.5749
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.2199
    R-Factor(R-Free) 0.2897
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5749
    Shell Resolution(Low) 2.6669
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2729
    R-Factor(R-Work) 0.2252
    R-Factor(R-Free) 0.2782
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6669
    Shell Resolution(Low) 2.7737
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.2207
    R-Factor(R-Free) 0.2697
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7737
    Shell Resolution(Low) 2.8998
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2794
    R-Factor(R-Work) 0.2189
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8998
    Shell Resolution(Low) 3.0526
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.2164
    R-Factor(R-Free) 0.2707
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0526
    Shell Resolution(Low) 3.2438
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2752
    R-Factor(R-Work) 0.2139
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2438
    Shell Resolution(Low) 3.4941
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.2098
    R-Factor(R-Free) 0.2433
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4941
    Shell Resolution(Low) 3.8453
    Number of Reflections(R-Free) 59
    Number of Reflections(R-Work) 1184
    R-Factor(R-Work) 0.1934
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 41.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8453
    Shell Resolution(Low) 4.4009
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.1651
    R-Factor(R-Free) 0.1953
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4009
    Shell Resolution(Low) 5.5415
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.1672
    R-Factor(R-Free) 0.1792
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5415
    Shell Resolution(Low) 36.2369
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2786
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.871
    f_plane_restr 0.003
    f_chiral_restr 0.055
    f_angle_d 0.772
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5961
    Nucleic Acid Atoms 0
    Heterogen Atoms 66
    Solvent Atoms 219
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.1_353)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_353)
    model building PHASER
    data collection HKL-2000