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X-RAY DIFFRACTION
Materials and Methods page
4GUT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 277.0
    Details 0.02M Citric acid, 0.03M Bis_tris propane, 10% PEG3350, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62 α = 90
    b = 89.76 β = 104.96
    c = 86.69 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type ADSC QUANTUM 315r
    Collection Date 2010-05-31
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97916
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(All) 59253
    Number Reflections(Observed) 56169
    Percent Possible(Observed) 90.19
    B(Isotropic) From Wilson Plot 26.83
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.998
    Resolution(Low) 35.917
    Cut-off Sigma(F) 0.08
    Number of Reflections(all) 59253
    Number of Reflections(Observed) 56166
    Number of Reflections(R-Free) 2835
    Percent Reflections(Observed) 90.19
    R-Factor(Observed) 0.1966
    R-Work 0.196
    R-Free 0.2072
     
    Temperature Factor Modeling
    Mean Isotropic B Value 39.159
    Anisotropic B[1][1] 0.9863
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 13.3841
    Anisotropic B[2][2] -5.0071
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.0208
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9976
    Shell Resolution(Low) 2.032
    Number of Reflections(R-Free) 82
    Number of Reflections(R-Work) 1844
    R-Factor(R-Work) 0.2555
    R-Factor(R-Free) 0.2895
    Percent Reflections(Observed) 62.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.032
    Shell Resolution(Low) 2.0689
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2061
    R-Factor(R-Work) 0.2447
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0689
    Shell Resolution(Low) 2.1087
    Number of Reflections(R-Free) 100
    Number of Reflections(R-Work) 2126
    R-Factor(R-Work) 0.2405
    R-Factor(R-Free) 0.2515
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1087
    Shell Resolution(Low) 2.1518
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2273
    R-Factor(R-Work) 0.2447
    R-Factor(R-Free) 0.2557
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1518
    Shell Resolution(Low) 2.1986
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2457
    R-Factor(R-Work) 0.2237
    R-Factor(R-Free) 0.2467
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1986
    Shell Resolution(Low) 2.2497
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2306
    R-Factor(R-Free) 0.2606
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2497
    Shell Resolution(Low) 2.3059
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.2325
    R-Factor(R-Free) 0.2822
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3059
    Shell Resolution(Low) 2.3683
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.2222
    R-Factor(R-Free) 0.2083
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3683
    Shell Resolution(Low) 2.438
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.2239
    R-Factor(R-Free) 0.2572
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.438
    Shell Resolution(Low) 2.5166
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2759
    R-Factor(R-Work) 0.2141
    R-Factor(R-Free) 0.2171
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5166
    Shell Resolution(Low) 2.6065
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2796
    R-Factor(R-Work) 0.2129
    R-Factor(R-Free) 0.2111
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6065
    Shell Resolution(Low) 2.7109
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2878
    R-Factor(R-Work) 0.2189
    R-Factor(R-Free) 0.2242
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7109
    Shell Resolution(Low) 2.8342
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 2819
    R-Factor(R-Work) 0.2087
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8342
    Shell Resolution(Low) 2.9836
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2905
    R-Factor(R-Work) 0.2167
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9836
    Shell Resolution(Low) 3.1704
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2879
    R-Factor(R-Work) 0.2058
    R-Factor(R-Free) 0.2094
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1704
    Shell Resolution(Low) 3.415
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 2917
    R-Factor(R-Work) 0.1998
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.415
    Shell Resolution(Low) 3.7583
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 3000
    R-Factor(R-Work) 0.1839
    R-Factor(R-Free) 0.1712
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7583
    Shell Resolution(Low) 4.3014
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2946
    R-Factor(R-Work) 0.165
    R-Factor(R-Free) 0.152
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3014
    Shell Resolution(Low) 5.4163
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2971
    R-Factor(R-Work) 0.1554
    R-Factor(R-Free) 0.174
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4163
    Shell Resolution(Low) 35.9229
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3043
    R-Factor(R-Work) 0.1728
    R-Factor(R-Free) 0.2047
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.357
    f_plane_restr 0.009
    f_chiral_restr 0.081
    f_angle_d 1.147
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5961
    Nucleic Acid Atoms 0
    Heterogen Atoms 78
    Solvent Atoms 346
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.1_353)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building PHASER
    data collection HKL-2000