X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6
Temperature 277.0
Details 0.02M Citric acid, 0.03M Bis_tris propane, 10% PEG3350, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 62 α = 90
b = 89.76 β = 104.96
c = 86.69 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE ADSC QUANTUM 315r -- 2010-05-31
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97916 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 50 90.19 -- -- -- -- 59253 56169 -- -- 26.83

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.998 35.917 -- 0.08 59253 56166 2835 90.19 -- 0.1966 0.196 0.2072 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9976 2.032 -- 82 1844 0.2555 0.2895 -- 62.0
X Ray Diffraction 2.032 2.0689 -- 118 2061 0.2447 0.264 -- 69.0
X Ray Diffraction 2.0689 2.1087 -- 100 2126 0.2405 0.2515 -- 73.0
X Ray Diffraction 2.1087 2.1518 -- 133 2273 0.2447 0.2557 -- 77.0
X Ray Diffraction 2.1518 2.1986 -- 120 2457 0.2237 0.2467 -- 84.0
X Ray Diffraction 2.1986 2.2497 -- 135 2554 0.2306 0.2606 -- 87.0
X Ray Diffraction 2.2497 2.3059 -- 156 2626 0.2325 0.2822 -- 89.0
X Ray Diffraction 2.3059 2.3683 -- 140 2741 0.2222 0.2083 -- 93.0
X Ray Diffraction 2.3683 2.438 -- 155 2736 0.2239 0.2572 -- 93.0
X Ray Diffraction 2.438 2.5166 -- 150 2759 0.2141 0.2171 -- 94.0
X Ray Diffraction 2.5166 2.6065 -- 143 2796 0.2129 0.2111 -- 95.0
X Ray Diffraction 2.6065 2.7109 -- 155 2878 0.2189 0.2242 -- 97.0
X Ray Diffraction 2.7109 2.8342 -- 183 2819 0.2087 0.2193 -- 97.0
X Ray Diffraction 2.8342 2.9836 -- 141 2905 0.2167 0.2149 -- 98.0
X Ray Diffraction 2.9836 3.1704 -- 157 2879 0.2058 0.2094 -- 98.0
X Ray Diffraction 3.1704 3.415 -- 171 2917 0.1998 0.2344 -- 99.0
X Ray Diffraction 3.415 3.7583 -- 124 3000 0.1839 0.1712 -- 100.0
X Ray Diffraction 3.7583 4.3014 -- 166 2946 0.165 0.152 -- 100.0
X Ray Diffraction 4.3014 5.4163 -- 160 2971 0.1554 0.174 -- 100.0
X Ray Diffraction 5.4163 35.9229 -- 146 3043 0.1728 0.2047 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 39.159
Anisotropic B[1][1] 0.9863
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 13.3841
Anisotropic B[2][2] -5.0071
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 4.0208
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 17.357
f_plane_restr 0.009
f_chiral_restr 0.081
f_angle_d 1.147
f_bond_d 0.011
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5961
Nucleic Acid Atoms 0
Heterogen Atoms 78
Solvent Atoms 346

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.6.1_353) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine) refinement
PHASER model building
HKL-2000 data collection