X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.2
Temperature 277.0
Details 0.1M Ammonium Iodide, 0.1M MES, 10% PEG3350, pH 6.2, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 101.08 α = 90
b = 101.08 β = 90
c = 177.37 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE ADSC QUANTUM 315r -- 2010-07-04
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 1.00001 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.23 50 94.31 -- -- -- -- -- 51612 -- -- 42.48

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.23 29.036 -- 1.34 -- 51600 2618 99.6 -- 0.2087 0.2071 0.237 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2302 2.2707 -- 138 2423 0.2842 0.3513 -- 95.0
X Ray Diffraction 2.2707 2.3144 -- 125 2555 0.272 0.2831 -- 100.0
X Ray Diffraction 2.3144 2.3616 -- 141 2558 0.2663 0.3165 -- 100.0
X Ray Diffraction 2.3616 2.413 -- 140 2553 0.2541 0.3017 -- 100.0
X Ray Diffraction 2.413 2.4691 -- 134 2568 0.2472 0.2955 -- 100.0
X Ray Diffraction 2.4691 2.5308 -- 154 2522 0.2512 0.2976 -- 100.0
X Ray Diffraction 2.5308 2.5991 -- 132 2571 0.2569 0.3312 -- 100.0
X Ray Diffraction 2.5991 2.6756 -- 136 2548 0.2435 0.3085 -- 100.0
X Ray Diffraction 2.6756 2.7619 -- 143 2557 0.2472 0.2888 -- 100.0
X Ray Diffraction 2.7619 2.8605 -- 132 2583 0.24 0.2991 -- 100.0
X Ray Diffraction 2.8605 2.9749 -- 135 2581 0.2399 0.2762 -- 100.0
X Ray Diffraction 2.9749 3.1102 -- 133 2571 0.241 0.2796 -- 100.0
X Ray Diffraction 3.1102 3.2739 -- 145 2568 0.2256 0.2709 -- 100.0
X Ray Diffraction 3.2739 3.4787 -- 138 2590 0.2183 0.289 -- 100.0
X Ray Diffraction 3.4787 3.7468 -- 128 2598 0.2028 0.2371 -- 100.0
X Ray Diffraction 3.7468 4.1229 -- 149 2586 0.1851 0.2181 -- 100.0
X Ray Diffraction 4.1229 4.7173 -- 143 2629 0.1654 0.1799 -- 100.0
X Ray Diffraction 4.7173 5.935 -- 133 2668 0.1691 0.1577 -- 100.0
X Ray Diffraction 5.935 29.0384 -- 139 2753 0.1774 0.1842 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 44.4129
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 17.892
f_plane_restr 0.006
f_chiral_restr 0.084
f_angle_d 1.209
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6160
Nucleic Acid Atoms 0
Heterogen Atoms 74
Solvent Atoms 281

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine) refinement
PHASER model building
HKL-2000 data collection