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X-RAY DIFFRACTION
Materials and Methods page
4GUS
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.2
    Temperature 277.0
    Details 0.1M Ammonium Iodide, 0.1M MES, 10% PEG3350, pH 6.2, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 101.08 α = 90
    b = 101.08 β = 90
    c = 177.37 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type ADSC QUANTUM 315r
    Collection Date 2010-07-04
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 1.00001
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.23
    Resolution(Low) 50
    Number Reflections(Observed) 51612
    Percent Possible(Observed) 94.31
    B(Isotropic) From Wilson Plot 42.48
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.23
    Resolution(Low) 29.036
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 51600
    Number of Reflections(R-Free) 2618
    Percent Reflections(Observed) 99.6
    R-Factor(Observed) 0.2087
    R-Work 0.2071
    R-Free 0.237
     
    Temperature Factor Modeling
    Mean Isotropic B Value 44.4129
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2302
    Shell Resolution(Low) 2.2707
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2423
    R-Factor(R-Work) 0.2842
    R-Factor(R-Free) 0.3513
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2707
    Shell Resolution(Low) 2.3144
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.272
    R-Factor(R-Free) 0.2831
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3144
    Shell Resolution(Low) 2.3616
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.2663
    R-Factor(R-Free) 0.3165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3616
    Shell Resolution(Low) 2.413
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.2541
    R-Factor(R-Free) 0.3017
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.413
    Shell Resolution(Low) 2.4691
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.2472
    R-Factor(R-Free) 0.2955
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4691
    Shell Resolution(Low) 2.5308
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2522
    R-Factor(R-Work) 0.2512
    R-Factor(R-Free) 0.2976
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5308
    Shell Resolution(Low) 2.5991
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.2569
    R-Factor(R-Free) 0.3312
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5991
    Shell Resolution(Low) 2.6756
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.2435
    R-Factor(R-Free) 0.3085
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6756
    Shell Resolution(Low) 2.7619
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2557
    R-Factor(R-Work) 0.2472
    R-Factor(R-Free) 0.2888
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7619
    Shell Resolution(Low) 2.8605
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2583
    R-Factor(R-Work) 0.24
    R-Factor(R-Free) 0.2991
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8605
    Shell Resolution(Low) 2.9749
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.2399
    R-Factor(R-Free) 0.2762
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9749
    Shell Resolution(Low) 3.1102
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.241
    R-Factor(R-Free) 0.2796
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1102
    Shell Resolution(Low) 3.2739
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.2256
    R-Factor(R-Free) 0.2709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2739
    Shell Resolution(Low) 3.4787
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2183
    R-Factor(R-Free) 0.289
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4787
    Shell Resolution(Low) 3.7468
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7468
    Shell Resolution(Low) 4.1229
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.1851
    R-Factor(R-Free) 0.2181
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1229
    Shell Resolution(Low) 4.7173
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1654
    R-Factor(R-Free) 0.1799
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7173
    Shell Resolution(Low) 5.935
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1691
    R-Factor(R-Free) 0.1577
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.935
    Shell Resolution(Low) 29.0384
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.1774
    R-Factor(R-Free) 0.1842
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.892
    f_plane_restr 0.006
    f_chiral_restr 0.084
    f_angle_d 1.209
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6160
    Nucleic Acid Atoms 0
    Heterogen Atoms 74
    Solvent Atoms 281
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building PHASER
    data collection HKL-2000