X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6
Temperature 277.0
Details 0.02M Citric acid, 0.03M Bis_tris propane, 10% PEG3350, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 62.24 α = 90
b = 89.03 β = 103.3
c = 88.78 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE ADSC QUANTUM 315r -- 2010-06-23
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97908 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 88.57 -- -- -- -- -- 28816 -- -- 39.29

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.506 38.867 -- 0.06 -- 28815 1471 88.57 -- 0.1888 0.1879 0.2045 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5061 2.5869 -- 119 2245 0.2747 0.3303 -- 80.0
X Ray Diffraction 2.5869 2.6794 -- 122 2362 0.2656 0.275 -- 85.0
X Ray Diffraction 2.6794 2.7866 -- 158 2384 0.242 0.289 -- 87.0
X Ray Diffraction 2.7866 2.9134 -- 127 2440 0.2253 0.2525 -- 88.0
X Ray Diffraction 2.9134 3.067 -- 147 2499 0.2187 0.2572 -- 89.0
X Ray Diffraction 3.067 3.259 -- 119 2546 0.2071 0.2358 -- 91.0
X Ray Diffraction 3.259 3.5105 -- 132 2569 0.188 0.214 -- 92.0
X Ray Diffraction 3.5105 3.8635 -- 136 2627 0.1688 0.1737 -- 93.0
X Ray Diffraction 3.8635 4.4219 -- 117 2603 0.1486 0.164 -- 92.0
X Ray Diffraction 4.4219 5.5685 -- 160 2540 0.1542 0.1575 -- 91.0
X Ray Diffraction 5.5685 38.8718 -- 134 2529 0.1688 0.1647 -- 88.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 51.6845
Anisotropic B[1][1] 5.1132
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 17.7246
Anisotropic B[2][2] -14.6968
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 9.5836
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 18.761
f_plane_restr 0.011
f_chiral_restr 0.095
f_angle_d 1.372
f_bond_d 0.012
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6074
Nucleic Acid Atoms 0
Heterogen Atoms 62
Solvent Atoms 98

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.6.1_353) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine) refinement
PHASER model building
HKL-2000 data collection