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X-RAY DIFFRACTION
Materials and Methods page
4GUR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 277.0
    Details 0.02M Citric acid, 0.03M Bis_tris propane, 10% PEG3350, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.24 α = 90
    b = 89.03 β = 103.3
    c = 88.78 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type ADSC QUANTUM 315r
    Collection Date 2010-06-23
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97908
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(Observed) 28816
    Percent Possible(Observed) 88.57
    B(Isotropic) From Wilson Plot 39.29
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.506
    Resolution(Low) 38.867
    Cut-off Sigma(F) 0.06
    Number of Reflections(Observed) 28815
    Number of Reflections(R-Free) 1471
    Percent Reflections(Observed) 88.57
    R-Factor(Observed) 0.1888
    R-Work 0.1879
    R-Free 0.2045
     
    Temperature Factor Modeling
    Mean Isotropic B Value 51.6845
    Anisotropic B[1][1] 5.1132
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 17.7246
    Anisotropic B[2][2] -14.6968
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 9.5836
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5061
    Shell Resolution(Low) 2.5869
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2245
    R-Factor(R-Work) 0.2747
    R-Factor(R-Free) 0.3303
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5869
    Shell Resolution(Low) 2.6794
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2362
    R-Factor(R-Work) 0.2656
    R-Factor(R-Free) 0.275
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6794
    Shell Resolution(Low) 2.7866
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2384
    R-Factor(R-Work) 0.242
    R-Factor(R-Free) 0.289
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7866
    Shell Resolution(Low) 2.9134
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2440
    R-Factor(R-Work) 0.2253
    R-Factor(R-Free) 0.2525
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9134
    Shell Resolution(Low) 3.067
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2499
    R-Factor(R-Work) 0.2187
    R-Factor(R-Free) 0.2572
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.067
    Shell Resolution(Low) 3.259
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2546
    R-Factor(R-Work) 0.2071
    R-Factor(R-Free) 0.2358
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.259
    Shell Resolution(Low) 3.5105
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5105
    Shell Resolution(Low) 3.8635
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.1737
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8635
    Shell Resolution(Low) 4.4219
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.1486
    R-Factor(R-Free) 0.164
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4219
    Shell Resolution(Low) 5.5685
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.1542
    R-Factor(R-Free) 0.1575
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5685
    Shell Resolution(Low) 38.8718
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.1647
    Percent Reflections(Observed) 88.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 18.761
    f_plane_restr 0.011
    f_chiral_restr 0.095
    f_angle_d 1.372
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6074
    Nucleic Acid Atoms 0
    Heterogen Atoms 62
    Solvent Atoms 98
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.1_353)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building PHASER
    data collection HKL-2000