X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 293.0
Details 30% Jeffamine ED2003, 0.1 M HEPES, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 98.08 α = 90
b = 40.69 β = 114.31
c = 83.26 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2011-11-30
Diffraction Radiation
Monochromator Protocol
Double crystal Si(220) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.000 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 30 99.8 -- 0.117 -- 4.3 29080 28004 0.0 5.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.84 100.0 -- 0.303 4.65 3.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 1.8 25.293 -- 0.0 28004 27492 1389 97.72 -- 0.1729 0.1712 0.2047 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7997 1.8641 -- 126 2410 0.1899 0.2642 -- 90.0
X Ray Diffraction 1.8641 1.9387 -- 139 2510 0.1808 0.2482 -- 95.0
X Ray Diffraction 1.9387 2.0269 -- 140 2575 0.179 0.203 -- 98.0
X Ray Diffraction 2.0269 2.1337 -- 120 2629 0.1712 0.2281 -- 98.0
X Ray Diffraction 2.1337 2.2673 -- 146 2604 0.1706 0.2014 -- 99.0
X Ray Diffraction 2.2673 2.4422 -- 129 2656 0.1776 0.2276 -- 99.0
X Ray Diffraction 2.4422 2.6877 -- 138 2660 0.1909 0.2327 -- 99.0
X Ray Diffraction 2.6877 3.0761 -- 142 2671 0.1816 0.2253 -- 100.0
X Ray Diffraction 3.0761 3.8733 -- 152 2668 0.1627 0.2043 -- 100.0
X Ray Diffraction 3.8733 25.2954 -- 157 2720 0.1618 0.176 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 5.4085
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -3.8809
Anisotropic B[2][2] 0.2734
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -5.682
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.066
f_dihedral_angle_d 15.188
f_angle_d 0.982
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2255
Nucleic Acid Atoms 0
Heterogen Atoms 38
Solvent Atoms 260

Software

Computing
Computing Package Purpose
MAR345dtb Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phenix Structure Solution
PHENIX (phenix.refine: 1.6.4_486) Structure Refinement
Software
Software Name Purpose
Phenix refinement
Phenix model building
MAR345dtb data collection