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X-RAY DIFFRACTION
Materials and Methods page
4GUE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 30% Jeffamine ED2003, 0.1 M HEPES, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 98.08 α = 90
    b = 40.69 β = 114.31
    c = 83.26 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-11-30
     
    Diffraction Radiation
    Monochromator Double crystal Si(220)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.000
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 5.0
    Resolution(High) 1.8
    Resolution(Low) 30
    Number Reflections(All) 29080
    Number Reflections(Observed) 28004
    Percent Possible(Observed) 99.8
    Redundancy 4.3
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.84
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 4.65
    R-Sym I(Observed) 0.303
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 1.8
    Resolution(Low) 25.293
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 28004
    Number of Reflections(Observed) 27492
    Number of Reflections(R-Free) 1389
    Percent Reflections(Observed) 97.72
    R-Factor(Observed) 0.1729
    R-Work 0.1712
    R-Free 0.2047
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.4085
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.8809
    Anisotropic B[2][2] 0.2734
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -5.682
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7997
    Shell Resolution(Low) 1.8641
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2410
    R-Factor(R-Work) 0.1899
    R-Factor(R-Free) 0.2642
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8641
    Shell Resolution(Low) 1.9387
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2510
    R-Factor(R-Work) 0.1808
    R-Factor(R-Free) 0.2482
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9387
    Shell Resolution(Low) 2.0269
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.179
    R-Factor(R-Free) 0.203
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0269
    Shell Resolution(Low) 2.1337
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1712
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1337
    Shell Resolution(Low) 2.2673
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2673
    Shell Resolution(Low) 2.4422
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.2276
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4422
    Shell Resolution(Low) 2.6877
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1909
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6877
    Shell Resolution(Low) 3.0761
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.2253
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0761
    Shell Resolution(Low) 3.8733
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1627
    R-Factor(R-Free) 0.2043
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8733
    Shell Resolution(Low) 25.2954
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1618
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.066
    f_dihedral_angle_d 15.188
    f_angle_d 0.982
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2255
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 260
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phenix
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement Phenix
    model building Phenix
    data collection MAR345dtb