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X-RAY DIFFRACTION
Materials and Methods page
4GU2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 3.5
    Temperature 291.0
    Details EhUbiquitin at 17 mg/mL was mixed 1:1 with and equilibrated against crystallization solution containing 25% (w/v) PEG 3350 and 100 mM citric acid, pH 3.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.8 α = 90
    b = 49.8 β = 90
    c = 63.83 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2012-04-08
     
    Diffraction Radiation
    Monochromator double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength 1.00000
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.35
    Resolution(Low) 25.65
    Number Reflections(All) 20637
    Number Reflections(Observed) 20493
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.043
    B(Isotropic) From Wilson Plot 19.1
    Redundancy 19.2
     
    High Resolution Shell Details
    Resolution(High) 1.35
    Resolution(Low) 1.36
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.557
    Mean I Over Sigma(Observed) 6.9
    Redundancy 17.9
    Number Unique Reflections(All) 486
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.35
    Resolution(Low) 25.65
    Cut-off Sigma(F) 1.38
    Number of Reflections(all) 20654
    Number of Reflections(Observed) 20454
    Number of Reflections(R-Free) 1028
    Percent Reflections(Observed) 99.03
    R-Factor(Observed) 0.215
    R-Work 0.212
    R-Free 0.2692
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.35
    Shell Resolution(Low) 1.4205
    Number of Reflections(Observed) 2718
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.2282
    R-Factor(R-Free) 0.3125
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4205
    Shell Resolution(Low) 1.5095
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2752
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.3026
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5095
    Shell Resolution(Low) 1.6261
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2757
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2783
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6261
    Shell Resolution(Low) 1.7897
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.2163
    R-Factor(R-Free) 0.271
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7897
    Shell Resolution(Low) 2.0486
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2787
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2692
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0486
    Shell Resolution(Low) 2.5806
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2826
    R-Factor(R-Work) 0.2243
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5806
    Shell Resolution(Low) 25.6588
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2813
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2771
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.079
    f_dihedral_angle_d 14.6
    f_angle_d 1.642
    f_bond_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 546
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 66
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX AutoMR
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHENIX version: AutoMR
    data collection HKL-2000