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X-RAY DIFFRACTION
Materials and Methods page
4GU0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 291.0
    Details 0.2M (NH4)2 Tartrate, 0.1M HEPES, 10% PEG20000, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 101.84 α = 94.47
    b = 108.93 β = 112.34
    c = 120.82 γ = 117.95
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type ADSC QUANTUM 315r
    Collection Date 2012-03-26
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97930
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.1
    Resolution(Low) 50
    Number Reflections(All) 71966
    Number Reflections(Observed) 68642
    Percent Possible(Observed) 94.23
    B(Isotropic) From Wilson Plot 66.84
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.103
    Resolution(Low) 45.059
    Cut-off Sigma(F) 0.11
    Number of Reflections(all) 71966
    Number of Reflections(Observed) 68642
    Number of Reflections(R-Free) 3457
    Percent Reflections(Observed) 94.23
    R-Factor(Observed) 0.2048
    R-Work 0.204
    R-Free 0.2211
     
    Temperature Factor Modeling
    Mean Isotropic B Value 77.403
    Anisotropic B[1][1] -15.707
    Anisotropic B[1][2] 2.4864
    Anisotropic B[1][3] -1.909
    Anisotropic B[2][2] -6.8076
    Anisotropic B[2][3] -5.9519
    Anisotropic B[3][3] 22.5147
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1033
    Shell Resolution(Low) 3.1458
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2076
    R-Factor(R-Work) 0.3036
    R-Factor(R-Free) 0.3163
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1458
    Shell Resolution(Low) 3.1907
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2405
    R-Factor(R-Work) 0.2913
    R-Factor(R-Free) 0.2923
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1907
    Shell Resolution(Low) 3.2384
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 2397
    R-Factor(R-Work) 0.2987
    R-Factor(R-Free) 0.3123
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2384
    Shell Resolution(Low) 3.289
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2484
    R-Factor(R-Work) 0.2847
    R-Factor(R-Free) 0.3361
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.289
    Shell Resolution(Low) 3.3429
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2422
    R-Factor(R-Work) 0.2643
    R-Factor(R-Free) 0.2682
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3429
    Shell Resolution(Low) 3.4005
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.268
    R-Factor(R-Free) 0.2801
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4005
    Shell Resolution(Low) 3.4623
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2447
    R-Factor(R-Work) 0.263
    R-Factor(R-Free) 0.3216
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4623
    Shell Resolution(Low) 3.5289
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.2472
    R-Factor(R-Free) 0.2759
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5289
    Shell Resolution(Low) 3.6009
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.2343
    R-Factor(R-Free) 0.2577
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6009
    Shell Resolution(Low) 3.6791
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.2227
    R-Factor(R-Free) 0.2587
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6791
    Shell Resolution(Low) 3.7647
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.209
    R-Factor(R-Free) 0.2691
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7647
    Shell Resolution(Low) 3.8588
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8588
    Shell Resolution(Low) 3.963
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.2103
    R-Factor(R-Free) 0.2391
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.963
    Shell Resolution(Low) 4.0796
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.1886
    R-Factor(R-Free) 0.2133
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0796
    Shell Resolution(Low) 4.2112
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.2045
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2112
    Shell Resolution(Low) 4.3616
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1647
    R-Factor(R-Free) 0.1686
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3616
    Shell Resolution(Low) 4.536
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.1432
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.536
    Shell Resolution(Low) 4.7423
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2724
    R-Factor(R-Work) 0.1664
    R-Factor(R-Free) 0.195
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7423
    Shell Resolution(Low) 4.992
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1623
    R-Factor(R-Free) 0.2135
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.992
    Shell Resolution(Low) 5.3043
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.1695
    R-Factor(R-Free) 0.1875
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3043
    Shell Resolution(Low) 5.7131
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.1759
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7131
    Shell Resolution(Low) 6.2867
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2001
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2867
    Shell Resolution(Low) 7.1932
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2759
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.192
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.1932
    Shell Resolution(Low) 9.0506
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.1548
    R-Factor(R-Free) 0.1603
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.0506
    Shell Resolution(Low) 45.0639
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.1709
    R-Factor(R-Free) 0.161
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.099
    f_plane_restr 0.01
    f_chiral_restr 0.051
    f_angle_d 0.798
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 23876
    Nucleic Acid Atoms 0
    Heterogen Atoms 224
    Solvent Atoms 56
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.1_353)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_353)
    model building PHASER
    data collection HKL-2000