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X-RAY DIFFRACTION
Materials and Methods page
4GSL
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.8
    Temperature 294.0
    Details 100 mM sodium citrate, pH 5.8, 13.5% PEG4000, 10% isopropanol, 5% dioxane, 88 mM ammonium sulfate, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 281.56 α = 90
    b = 125.08 β = 103.32
    c = 71.08 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-02-02
     
    Diffraction Radiation
    Monochromator single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.9792
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.7
    Resolution(Low) 40
    Number Reflections(All) 65155
    Number Reflections(Observed) 64845
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.079
    Redundancy 4.1
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.8
    Percent Possible(All) 99.0
    R Merge I(Observed) 0.556
    Redundancy 4.0
    Number Unique Reflections(All) 6400
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.703
    Resolution(Low) 37.073
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 64763
    Number of Reflections(Observed) 64763
    Number of Reflections(R-Free) 1901
    Percent Reflections(Observed) 98.66
    R-Factor(All) 0.1943
    R-Factor(Observed) 0.1943
    R-Work 0.1927
    R-Free 0.2462
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 70.5395
    Anisotropic B[1][1] 6.8972
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -4.4035
    Anisotropic B[2][2] -6.0097
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.8876
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.703
    Shell Resolution(Low) 2.7702
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 4022
    R-Factor(R-Work) 0.2916
    R-Factor(R-Free) 0.3671
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7702
    Shell Resolution(Low) 2.845
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 4483
    R-Factor(R-Work) 0.2737
    R-Factor(R-Free) 0.3604
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.845
    Shell Resolution(Low) 2.9287
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 4477
    R-Factor(R-Work) 0.2456
    R-Factor(R-Free) 0.3301
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9287
    Shell Resolution(Low) 3.0232
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4486
    R-Factor(R-Work) 0.2249
    R-Factor(R-Free) 0.2966
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0232
    Shell Resolution(Low) 3.1312
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4524
    R-Factor(R-Work) 0.2177
    R-Factor(R-Free) 0.3068
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1312
    Shell Resolution(Low) 3.2565
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4500
    R-Factor(R-Work) 0.2036
    R-Factor(R-Free) 0.2509
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2565
    Shell Resolution(Low) 3.4046
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 4500
    R-Factor(R-Work) 0.2194
    R-Factor(R-Free) 0.3072
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4046
    Shell Resolution(Low) 3.584
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4560
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2363
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.584
    Shell Resolution(Low) 3.8083
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4490
    R-Factor(R-Work) 0.1762
    R-Factor(R-Free) 0.2068
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8083
    Shell Resolution(Low) 4.102
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4539
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.102
    Shell Resolution(Low) 4.5142
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 4562
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.2085
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5142
    Shell Resolution(Low) 5.1659
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4556
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1659
    Shell Resolution(Low) 6.5028
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4591
    R-Factor(R-Work) 0.2098
    R-Factor(R-Free) 0.2418
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5028
    Shell Resolution(Low) 37.0768
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4572
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.2198
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.171
    f_plane_restr 0.006
    f_chiral_restr 0.081
    f_angle_d 1.214
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12498
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 43
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction SCALEPACK