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X-RAY DIFFRACTION
Materials and Methods page
4GRG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5
    Temperature 298.0
    Details 0.1 M Phosphate-citrate pH 4.2, 5% (w/v) PEG-3000, 25% (v/v) 1,2-propanediol, 10% (v/v) glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 71.32 α = 90
    b = 71.32 β = 90
    c = 178.52 γ = 120
     
    Space Group
    Space Group Name:    P 32
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-09-08
     
    Diffraction Radiation
    Monochromator Double flat crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 1.1159
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 4.24
    Resolution(Low) 178.52
    Number Reflections(All) 9512
    Number Reflections(Observed) 8467
    Percent Possible(Observed) 89.01
     
    High Resolution Shell Details
    Resolution(High) 4.24
    Resolution(Low) 4.31
    Percent Possible(All) 99.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 4.24
    Resolution(Low) 29.753
    Cut-off Sigma(F) 1.96
    Number of Reflections(all) 9512
    Number of Reflections(Observed) 6399
    Number of Reflections(R-Free) 303
    Percent Reflections(Observed) 89.17
    R-Factor(Observed) 0.2734
    R-Work 0.2704
    R-Free 0.3378
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 7.63
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 7.63
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -13.7428
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2404
    Shell Resolution(Low) 5.3375
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.303
    R-Factor(R-Free) 0.3748
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3375
    Shell Resolution(Low) 29.7541
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 3397
    R-Factor(R-Work) 0.2603
    R-Factor(R-Free) 0.3249
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.081
    f_dihedral_angle_d 16.119
    f_angle_d 1.397
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5154
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement REFMAC version: 5.5.0109
    model building PHASES
    data collection HKL-2000