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X-RAY DIFFRACTION
Materials and Methods page
4GR6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.6
    Temperature 292.0
    Details 15% PEG 400, 100 mM sodium citrate , pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.77 α = 90
    b = 63.3 β = 96.57
    c = 57.32 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU RAXIS IV++
    Collection Date 2012-05-21
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2
    Resolution(Low) 33.75
    Number Reflections(All) 21808
    Number Reflections(Observed) 21808
    Percent Possible(Observed) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 21.167
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 21785
    Number of Reflections(R-Free) 1112
    Percent Reflections(Observed) 98.4
    R-Factor(All) 0.175
    R-Factor(Observed) 0.175
    R-Work 0.1737
    R-Free 0.1964
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0001
    Shell Resolution(Low) 2.091
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2523
    R-Factor(R-Work) 0.1964
    R-Factor(R-Free) 0.2251
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.091
    Shell Resolution(Low) 2.2011
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.1787
    R-Factor(R-Free) 0.1958
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2011
    Shell Resolution(Low) 2.3389
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2535
    R-Factor(R-Work) 0.1669
    R-Factor(R-Free) 0.1932
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3389
    Shell Resolution(Low) 2.5192
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.1622
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5192
    Shell Resolution(Low) 2.7722
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.196
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7722
    Shell Resolution(Low) 3.1722
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.1755
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1722
    Shell Resolution(Low) 3.9923
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.1775
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9923
    Shell Resolution(Low) 21.1685
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.181
    R-Factor(R-Free) 0.205
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.077
    f_dihedral_angle_d 14.301
    f_angle_d 1.206
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1700
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 91
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution Phenix
    Structure Refinement PHENIX (phenix.refine: 1.8_1062)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1062)
    model building Phenix
    data collection CrystalClear