X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.6
Temperature 295.0
Details 0.1M sodium acetate pH 4.6, 2.0M ammonium sulfate, VAPOR DIFFUSION, HANGING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 55.82 α = 90
b = 55.82 β = 90
c = 83 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210r -- 2011-02-17
Diffraction Radiation
Monochromator Protocol
double-crystal Si(111) liquid-nitrogen-cooled SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE AR-NW12A 1.0 PHOTON FACTORY AR-NW12A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 99.9 -- 0.044 -- 11.9 -- 9801 1.0 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.201 31.489 -- 1.16 -- 7598 752 95.27 -- 0.2632 0.2578 0.311 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2005 2.3704 -- 139 1248 0.3482 0.3987 -- 89.0
X Ray Diffraction 2.3704 2.6088 -- 145 1314 0.3233 0.4199 -- 93.0
X Ray Diffraction 2.6088 2.986 -- 146 1358 0.3119 0.3749 -- 96.0
X Ray Diffraction 2.986 3.7611 -- 157 1436 0.2514 0.3445 -- 99.0
X Ray Diffraction 3.7611 31.4918 -- 165 1490 0.2228 0.2481 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.046
f_dihedral_angle_d 13.516
f_angle_d 0.728
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1020
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 30

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASES Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASES model building
HKL-2000 data collection