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X-RAY DIFFRACTION
Materials and Methods page
4GQW
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 295.0
    Details 0.1M sodium acetate pH 4.6, 2.0M ammonium sulfate, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55.82 α = 90
    b = 55.82 β = 90
    c = 83 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Collection Date 2011-02-17
     
    Diffraction Radiation
    Monochromator double-crystal Si(111) liquid-nitrogen-cooled
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 1.0
    Site PHOTON FACTORY
    Beamline AR-NW12A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(Observed) 9801
    Percent Possible(Observed) 99.9
    Redundancy 11.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.201
    Resolution(Low) 31.489
    Cut-off Sigma(F) 1.16
    Number of Reflections(Observed) 7598
    Number of Reflections(R-Free) 752
    Percent Reflections(Observed) 95.27
    R-Factor(Observed) 0.2632
    R-Work 0.2578
    R-Free 0.311
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2005
    Shell Resolution(Low) 2.3704
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1248
    R-Factor(R-Work) 0.3482
    R-Factor(R-Free) 0.3987
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3704
    Shell Resolution(Low) 2.6088
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1314
    R-Factor(R-Work) 0.3233
    R-Factor(R-Free) 0.4199
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6088
    Shell Resolution(Low) 2.986
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1358
    R-Factor(R-Work) 0.3119
    R-Factor(R-Free) 0.3749
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.986
    Shell Resolution(Low) 3.7611
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1436
    R-Factor(R-Work) 0.2514
    R-Factor(R-Free) 0.3445
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7611
    Shell Resolution(Low) 31.4918
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 1490
    R-Factor(R-Work) 0.2228
    R-Factor(R-Free) 0.2481
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.046
    f_dihedral_angle_d 13.516
    f_angle_d 0.728
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1020
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 30
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASES
    data collection HKL-2000