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X-RAY DIFFRACTION
Materials and Methods page
4GQV
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.2
    Temperature 295.0
    Details 100mM phophate-acetate pH 4.2, 200mM NaCl, 20%(w/w) PEG 8000, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.36 α = 90
    b = 56.36 β = 90
    c = 82.6 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Collection Date 2007-06-23
     
    Diffraction Radiation
    Monochromator Double-crystal Si(111) liquid-nitrogen-cooled
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 0.97923
    Site PHOTON FACTORY
    Beamline AR-NW12A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.39
    Resolution(Low) 50
    Number Reflections(Observed) 11556
    B(Isotropic) From Wilson Plot 60.27
    Redundancy 10.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.392
    Resolution(Low) 31.527
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 11556
    Number of Reflections(R-Free) 1158
    Percent Reflections(Observed) 99.55
    R-Factor(Observed) 0.2547
    R-Work 0.2484
    R-Free 0.3095
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3922
    Shell Resolution(Low) 2.501
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1293
    R-Factor(R-Work) 0.2811
    R-Factor(R-Free) 0.3956
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.501
    Shell Resolution(Low) 2.6328
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1282
    R-Factor(R-Work) 0.2767
    R-Factor(R-Free) 0.3327
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6328
    Shell Resolution(Low) 2.7977
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1326
    R-Factor(R-Work) 0.2777
    R-Factor(R-Free) 0.3831
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7977
    Shell Resolution(Low) 3.0136
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1289
    R-Factor(R-Work) 0.2656
    R-Factor(R-Free) 0.3796
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0136
    Shell Resolution(Low) 3.3165
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 1321
    R-Factor(R-Work) 0.2549
    R-Factor(R-Free) 0.3316
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3165
    Shell Resolution(Low) 3.7957
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1298
    R-Factor(R-Work) 0.2236
    R-Factor(R-Free) 0.267
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7957
    Shell Resolution(Low) 4.7796
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1303
    R-Factor(R-Work) 0.2244
    R-Factor(R-Free) 0.2632
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7796
    Shell Resolution(Low) 31.5297
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1286
    R-Factor(R-Work) 0.2637
    R-Factor(R-Free) 0.3254
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 18.18
    f_angle_d 1.19
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 946
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 34
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASES
    data collection HKL-2000