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X-RAY DIFFRACTION
Materials and Methods page
4GP6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 298.0
    Details 100mM HEPES, 200mM MgCl2, 30% PEG 400, 2mM ATP, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 43.69 α = 90
    b = 71.56 β = 90
    c = 118.61 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 130
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-03-18
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.10
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.1
    Resolution(Low) 45.6
    Number Reflections(All) 22461
    Number Reflections(Observed) 22214
    Percent Possible(Observed) 98.9
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.21
    Percent Possible(All) 92.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 35.78
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 22414
    Number of Reflections(Observed) 22154
    Number of Reflections(R-Free) 1740
    Percent Reflections(Observed) 98.84
    R-Factor(Observed) 0.181
    R-Work 0.1769
    R-Free 0.2282
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.8629
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.7078
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -12.5707
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.1618
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 1505
    R-Factor(R-Work) 0.2091
    R-Factor(R-Free) 0.2748
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1618
    Shell Resolution(Low) 2.2316
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1630
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.2898
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2316
    Shell Resolution(Low) 2.3113
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1698
    R-Factor(R-Work) 0.1923
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3113
    Shell Resolution(Low) 2.4039
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1699
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.3049
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4039
    Shell Resolution(Low) 2.5133
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1677
    R-Factor(R-Work) 0.1871
    R-Factor(R-Free) 0.2385
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5133
    Shell Resolution(Low) 2.6457
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1710
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.243
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6457
    Shell Resolution(Low) 2.8114
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1722
    R-Factor(R-Work) 0.1934
    R-Factor(R-Free) 0.2921
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8114
    Shell Resolution(Low) 3.0284
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1700
    R-Factor(R-Work) 0.1818
    R-Factor(R-Free) 0.2454
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0284
    Shell Resolution(Low) 3.3329
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1712
    R-Factor(R-Work) 0.179
    R-Factor(R-Free) 0.2401
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3329
    Shell Resolution(Low) 3.8148
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1743
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.203
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8148
    Shell Resolution(Low) 4.8044
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1761
    R-Factor(R-Work) 0.1406
    R-Factor(R-Free) 0.1722
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8044
    Shell Resolution(Low) 35.7852
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1857
    R-Factor(R-Work) 0.1841
    R-Factor(R-Free) 0.1958
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.064
    f_dihedral_angle_d 15.729
    f_angle_d 1.095
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2729
    Nucleic Acid Atoms 0
    Heterogen Atoms 56
    Solvent Atoms 237
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHENIX
    data collection CBASS