X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5
Temperature 291.0
Details EhRGS-RhoGEF at 13 mg/mL in 50 mM HEPES pH 7.5, 100 mM NaCl, and 5 mM DTT was mixed 1:1 with and equilibrated against crystalization solution (16% w/v PEG 3350 and 100 mM sodium malonate pH 5.0), VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 86.12 α = 90
b = 46.26 β = 104.2
c = 142.64 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR scanner 300 mm plate -- 2010-10-11
Diffraction Radiation
Monochromator Protocol
double crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 0.97954 APS 23-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 98.8 0.089 -- -- 4.3 47401 46832 1.33 0.0 25.6
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.32 86.4 0.584 -- 2.0 2.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.3 46.092 -- 1.33 47489 46587 2353 98.1 -- 0.1853 0.1825 0.2357 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3 2.3458 -- 121 2255 0.2647 0.3204 -- 84.0
X Ray Diffraction 2.3458 2.3968 -- 118 2413 0.2403 0.2662 -- 93.0
X Ray Diffraction 2.3968 2.4526 -- 155 2636 0.2293 0.3164 -- 97.0
X Ray Diffraction 2.4526 2.5139 -- 113 2576 0.2297 0.28 -- 99.0
X Ray Diffraction 2.5139 2.5818 -- 158 2679 0.2187 0.2613 -- 99.0
X Ray Diffraction 2.5818 2.6578 -- 116 2550 0.2256 0.2761 -- 99.0
X Ray Diffraction 2.6578 2.7436 -- 155 2688 0.2105 0.2898 -- 99.0
X Ray Diffraction 2.7436 2.8416 -- 127 2612 0.2046 0.3098 -- 100.0
X Ray Diffraction 2.8416 2.9554 -- 136 2617 0.2005 0.2227 -- 100.0
X Ray Diffraction 2.9554 3.0899 -- 146 2711 0.1962 0.2721 -- 100.0
X Ray Diffraction 3.0899 3.2527 -- 134 2649 0.1949 0.2466 -- 100.0
X Ray Diffraction 3.2527 3.4565 -- 148 2603 0.183 0.2666 -- 100.0
X Ray Diffraction 3.4565 3.7232 -- 140 2666 0.1631 0.2092 -- 100.0
X Ray Diffraction 3.7232 4.0977 -- 155 2667 0.1511 0.227 -- 100.0
X Ray Diffraction 4.0977 4.6902 -- 132 2643 0.1429 0.17 -- 100.0
X Ray Diffraction 4.6902 5.9072 -- 146 2630 0.16 0.2029 -- 100.0
X Ray Diffraction 5.9072 46.092 -- 153 2639 0.1572 0.1885 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.072
f_dihedral_angle_d 14.875
f_angle_d 1.08
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4147
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 216

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX AutoSol Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHENIX version: AutoSol model building
HKL-2000 data collection