POP-OUT | CLOSE

An Information Portal to 111558 Biological Macromolecular Structures

X-RAY DIFFRACTION
Materials and Methods page
4GOU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5
    Temperature 291.0
    Details EhRGS-RhoGEF at 13 mg/mL in 50 mM HEPES pH 7.5, 100 mM NaCl, and 5 mM DTT was mixed 1:1 with and equilibrated against crystalization solution (16% w/v PEG 3350 and 100 mM sodium malonate pH 5.0), VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 86.12 α = 90
    b = 46.26 β = 104.2
    c = 142.64 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2010-10-11
     
    Diffraction Radiation
    Monochromator double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-D
    Wavelength List 0.97954
    Site APS
    Beamline 23-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.33
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 47401
    Number Reflections(Observed) 46832
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.089
    B(Isotropic) From Wilson Plot 25.6
    Redundancy 4.3
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.32
    Percent Possible(All) 86.4
    R Merge I(Observed) 0.584
    Mean I Over Sigma(Observed) 2.0
    Redundancy 2.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.3
    Resolution(Low) 46.092
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 47489
    Number of Reflections(Observed) 46587
    Number of Reflections(R-Free) 2353
    Percent Reflections(Observed) 98.1
    R-Factor(Observed) 0.1853
    R-Work 0.1825
    R-Free 0.2357
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3458
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2255
    R-Factor(R-Work) 0.2647
    R-Factor(R-Free) 0.3204
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3458
    Shell Resolution(Low) 2.3968
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2413
    R-Factor(R-Work) 0.2403
    R-Factor(R-Free) 0.2662
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3968
    Shell Resolution(Low) 2.4526
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.2293
    R-Factor(R-Free) 0.3164
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4526
    Shell Resolution(Low) 2.5139
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.2297
    R-Factor(R-Free) 0.28
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5139
    Shell Resolution(Low) 2.5818
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.2187
    R-Factor(R-Free) 0.2613
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5818
    Shell Resolution(Low) 2.6578
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2550
    R-Factor(R-Work) 0.2256
    R-Factor(R-Free) 0.2761
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6578
    Shell Resolution(Low) 2.7436
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.2105
    R-Factor(R-Free) 0.2898
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7436
    Shell Resolution(Low) 2.8416
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.2046
    R-Factor(R-Free) 0.3098
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8416
    Shell Resolution(Low) 2.9554
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2227
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9554
    Shell Resolution(Low) 3.0899
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2721
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0899
    Shell Resolution(Low) 3.2527
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.2466
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2527
    Shell Resolution(Low) 3.4565
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2666
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4565
    Shell Resolution(Low) 3.7232
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.1631
    R-Factor(R-Free) 0.2092
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7232
    Shell Resolution(Low) 4.0977
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0977
    Shell Resolution(Low) 4.6902
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1429
    R-Factor(R-Free) 0.17
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6902
    Shell Resolution(Low) 5.9072
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.16
    R-Factor(R-Free) 0.2029
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9072
    Shell Resolution(Low) 46.092
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.1572
    R-Factor(R-Free) 0.1885
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 14.875
    f_angle_d 1.08
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4147
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 216
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX AutoSol
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHENIX version: AutoSol
    data collection HKL-2000