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X-RAY DIFFRACTION
Materials and Methods page
4GOT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 277.0
    Details 40.0% polyethylene glycol 400, 0.2M lithium sulfate, 0.1M TRIS pH 8.5, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 120.44 α = 90
    b = 39.13 β = 100.91
    c = 55.66 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details Flat mirror (vertical focusing); single crystal Si(111) bent monochromator (horizontal focusing)
    Collection Date 2012-08-02
     
    Diffraction Radiation
    Monochromator single crystal Si(111) bent
    Diffraction Protocol single wavelength
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength 0.97879
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.95
    Resolution(Low) 44.56
    Number Reflections(Observed) 16953
    Percent Possible(Observed) 89.9
    R Merge I(Observed) 0.102
    B(Isotropic) From Wilson Plot 24.42
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.02
    Percent Possible(All) 50.8
    R Merge I(Observed) 0.588
    Mean I Over Sigma(Observed) 2.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.95
    Resolution(Low) 44.561
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 16950
    Number of Reflections(R-Free) 876
    Percent Reflections(Observed) 90.24
    R-Factor(Observed) 0.1747
    R-Work 0.1717
    R-Free 0.2286
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 36.9041
    Anisotropic B[1][1] -1.35
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.61
    Anisotropic B[2][2] -0.05
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.03
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.953
    Shell Resolution(Low) 2.004
    Number of Reflections(R-Free) 33
    Number of Reflections(R-Work) 636
    R-Factor(R-Work) 0.255
    R-Factor(R-Free) 0.316
    Percent Reflections(Observed) 50.04
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.007
    r_chiral_restr 0.092
    r_dihedral_angle_4_deg 13.443
    r_dihedral_angle_3_deg 15.125
    r_dihedral_angle_2_deg 39.433
    r_dihedral_angle_1_deg 6.147
    r_angle_other_deg 0.969
    r_angle_refined_deg 1.602
    r_bond_other_d 0.001
    r_bond_refined_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1946
    Nucleic Acid Atoms 0
    Heterogen Atoms 14
    Solvent Atoms 175
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELXD,SHARP
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC5 version: 5.6.0117
    data processing Xscale version: March 15, 2012
    phasing SHARP
    phasing SHELX
    data extraction pdb_extract version: 3.10
    validation MOLPROBITY version: 3beta29