X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 277.0
Details 40.0% polyethylene glycol 400, 0.2M lithium sulfate, 0.1M TRIS pH 8.5, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 120.44 α = 90
b = 39.13 β = 100.91
c = 55.66 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M Flat mirror (vertical focusing); single crystal Si(111) bent monochromator (horizontal focusing) 2012-08-02
Diffraction Radiation
Monochromator Protocol
single crystal Si(111) bent SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 -- SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 44.56 89.9 0.102 -- -- -- -- 16953 -- -3.0 24.42
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.95 2.02 50.8 0.588 -- 2.2 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.95 44.561 -- 0.0 -- 16950 876 90.24 -- 0.1747 0.1717 0.2286 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.953 2.004 -- 33 636 0.255 0.316 -- 50.04
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 36.9041
Anisotropic B[1][1] -1.35
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -3.61
Anisotropic B[2][2] -0.05
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.03
RMS Deviations
Key Refinement Restraint Deviation
r_bond_refined_d 0.015
r_angle_refined_deg 1.602
r_dihedral_angle_3_deg 15.125
r_dihedral_angle_4_deg 13.443
r_angle_other_deg 0.969
r_gen_planes_other 0.001
r_bond_other_d 0.001
r_chiral_restr 0.092
r_gen_planes_refined 0.007
r_dihedral_angle_1_deg 6.147
r_dihedral_angle_2_deg 39.433
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1946
Nucleic Acid Atoms 0
Heterogen Atoms 14
Solvent Atoms 175

Software

Software
Software Name Purpose
MOLPROBITY validation version: 3beta29
PDB_EXTRACT data extraction version: 3.10
SHELX phasing
SHARP phasing
XSCALE data scaling version: March 15, 2012
REFMAC refinement version: 5.6.0117
XDS data reduction
SHELXD phasing