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X-RAY DIFFRACTION
Materials and Methods page
4GOE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5
    Temperature 277.0
    Details 10% 2-propanol, 0.1 M sodium citrate, 26% PEG 400, 10 mM 2-mercaptoethanol, pH 5.0, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 29.73 α = 90
    b = 44.13 β = 90
    c = 63.97 γ = 90
     
    Space Group
    Space Group Name:    P 2 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Collection Date 2012-01-26
     
    Diffraction Radiation
    Monochromator Liquid nitrogen-cooled double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL12-2
    Wavelength List 1.0000
    Site SSRL
    Beamline BL12-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.45
    Resolution(Low) 29.73
    Number Reflections(Observed) 15303
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.093
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 1.45
    Resolution(Low) 1.47
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.728
    Mean I Over Sigma(Observed) 1.8
    Redundancy 3.6
    Number Unique Reflections(All) 767
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.45
    Resolution(Low) 29.726
    Cut-off Sigma(F) 1.55
    Number of Reflections(Observed) 15276
    Number of Reflections(R-Free) 1093
    Percent Reflections(Observed) 98.31
    R-Factor(Observed) 0.1824
    R-Work 0.1808
    R-Free 0.203
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.45
    Shell Resolution(Low) 1.516
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1764
    R-Factor(R-Work) 0.2335
    R-Factor(R-Free) 0.2513
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.516
    Shell Resolution(Low) 1.5959
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 1763
    R-Factor(R-Work) 0.2284
    R-Factor(R-Free) 0.2507
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5959
    Shell Resolution(Low) 1.6959
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1744
    R-Factor(R-Work) 0.2002
    R-Factor(R-Free) 0.2525
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6959
    Shell Resolution(Low) 1.8268
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1752
    R-Factor(R-Work) 0.1973
    R-Factor(R-Free) 0.2379
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8268
    Shell Resolution(Low) 2.0106
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1751
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.2328
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0106
    Shell Resolution(Low) 2.3015
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1764
    R-Factor(R-Work) 0.1518
    R-Factor(R-Free) 0.1667
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3015
    Shell Resolution(Low) 2.8992
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1791
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.1896
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8992
    Shell Resolution(Low) 29.7322
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1854
    R-Factor(R-Work) 0.1734
    R-Factor(R-Free) 0.1871
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.066
    f_dihedral_angle_d 17.166
    f_angle_d 0.976
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 751
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 107
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection BLU-ICE