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X-RAY DIFFRACTION
Materials and Methods page
4GOD
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 277.0
    Details 45% 2-methyl-2,4-pentanediol, 0.2 M ammonium acetate, 0.1 M Tris, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 23.6 α = 90
    b = 57.04 β = 90
    c = 64.95 γ = 90
     
    Space Group
    Space Group Name:    P 2 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Collection Date 2012-01-07
     
    Diffraction Radiation
    Monochromator Liquid nitrogen-cooled double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL12-2
    Wavelength List 1.000
    Site SSRL
    Beamline BL12-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.4
    Resolution(Low) 28.22
    Number Reflections(Observed) 17693
    Percent Possible(Observed) 98.7
    R Merge I(Observed) 0.078
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 1.4
    Resolution(Low) 1.42
    Percent Possible(All) 98.9
    R Merge I(Observed) 0.64
    Mean I Over Sigma(Observed) 1.8
    Redundancy 3.2
    Number Unique Reflections(All) 851
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.4
    Resolution(Low) 28.222
    Cut-off Sigma(F) 1.78
    Number of Reflections(Observed) 17666
    Number of Reflections(R-Free) 1281
    Percent Reflections(Observed) 98.25
    R-Factor(Observed) 0.1973
    R-Work 0.1965
    R-Free 0.2083
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4
    Shell Resolution(Low) 1.4561
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1753
    R-Factor(R-Work) 0.2711
    R-Factor(R-Free) 0.2598
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4561
    Shell Resolution(Low) 1.5223
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1812
    R-Factor(R-Work) 0.2374
    R-Factor(R-Free) 0.257
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5223
    Shell Resolution(Low) 1.6026
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1815
    R-Factor(R-Work) 0.2279
    R-Factor(R-Free) 0.2664
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6026
    Shell Resolution(Low) 1.703
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1825
    R-Factor(R-Work) 0.2086
    R-Factor(R-Free) 0.2232
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.703
    Shell Resolution(Low) 1.8345
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1814
    R-Factor(R-Work) 0.2116
    R-Factor(R-Free) 0.2311
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8345
    Shell Resolution(Low) 2.019
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1790
    R-Factor(R-Work) 0.1903
    R-Factor(R-Free) 0.1996
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.019
    Shell Resolution(Low) 2.3111
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1845
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.1885
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3111
    Shell Resolution(Low) 2.9112
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1792
    R-Factor(R-Work) 0.1856
    R-Factor(R-Free) 0.1779
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9112
    Shell Resolution(Low) 28.2273
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1939
    R-Factor(R-Work) 0.1904
    R-Factor(R-Free) 0.2119
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.058
    f_dihedral_angle_d 20.062
    f_angle_d 1.015
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 724
    Nucleic Acid Atoms 0
    Heterogen Atoms 16
    Solvent Atoms 110
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection BLU-ICE