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X-RAY DIFFRACTION
Materials and Methods page
4GNY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.4
    Temperature 291.0
    Details 1.34 M trisodium citrate in 0.05 M Tris-HCl buffer, pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 53.98 α = 90
    b = 53.98 β = 90
    c = 112.86 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 110
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details mirrors
    Collection Date 2011-07-28
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.64
    Resolution(Low) 46.74
    Number Reflections(All) 24034
    Number Reflections(Observed) 23914
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.044
    B(Isotropic) From Wilson Plot 26.9
    Redundancy 5.4
     
    High Resolution Shell Details
    Resolution(High) 1.6367
    Resolution(Low) 1.695
    Percent Possible(All) 97.6
    R Merge I(Observed) 0.398
    Mean I Over Sigma(Observed) 2.9
    Redundancy 4.8
    Number Unique Reflections(All) 2266
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6367
    Resolution(Low) 46.745
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 24034
    Number of Reflections(Observed) 23914
    Number of Reflections(R-Free) 1229
    Percent Reflections(Observed) 99.5
    R-Factor(Observed) 0.2004
    R-Work 0.199
    R-Free 0.2258
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6367
    Shell Resolution(Low) 1.7022
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2417
    R-Factor(R-Work) 0.2372
    R-Factor(R-Free) 0.2879
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7022
    Shell Resolution(Low) 1.7797
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2472
    R-Factor(R-Work) 0.2362
    R-Factor(R-Free) 0.2876
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7797
    Shell Resolution(Low) 1.8735
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2502
    R-Factor(R-Work) 0.2425
    R-Factor(R-Free) 0.2538
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8735
    Shell Resolution(Low) 1.9909
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2477
    R-Factor(R-Work) 0.2833
    R-Factor(R-Free) 0.3376
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9909
    Shell Resolution(Low) 2.1446
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2512
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2512
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1446
    Shell Resolution(Low) 2.3604
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2488
    R-Factor(R-Work) 0.2337
    R-Factor(R-Free) 0.2602
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3604
    Shell Resolution(Low) 2.702
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.2122
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.702
    Shell Resolution(Low) 3.404
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.2458
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.404
    Shell Resolution(Low) 46.7645
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1697
    R-Factor(R-Free) 0.1795
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.079
    f_dihedral_angle_d 15.246
    f_angle_d 1.188
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1242
    Nucleic Acid Atoms 0
    Heterogen Atoms 23
    Solvent Atoms 127
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1131)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1131)
    model building PHASER
    data collection CrystalClear