X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.75
Temperature 277.15
Details 100 mM MES pH 6.75, 100-200 mM NaCl, and 11-12% PEG 3350, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 91.42 α = 90
b = 188.85 β = 90
c = 293.86 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 110
2 110
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR MARMOSAIC 300 mm CCD -- 2011-06-11
AREA DETECTOR MARMOSAIC 300 mm CCD -- 2011-03-21
Diffraction Radiation
Monochromator Protocol
double crystal monochromator SINGLE WAVELENGTH
Kohzu monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 1.03 APS 23-ID-D
SYNCHROTRON APS BEAMLINE 21-ID-D 1.13 APS 21-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
4 20 76.7 0.14 -- -- 3.3 41201 34695 -999.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
4.0 4.07 36.7 0.329 -- 1.9 2.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 4.0 19.99 -- -- -- 32433 1715 77.78 -- 0.21588 0.21386 0.25468 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 4.0 4.1 -- 96 1773 0.367 0.355 -- 63.04
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 113.58
Anisotropic B[1][1] -0.07
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.04
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.03
RMS Deviations
Key Refinement Restraint Deviation
r_gen_planes_other 0.001
r_gen_planes_refined 0.003
r_chiral_restr 0.049
r_dihedral_angle_4_deg 10.068
r_dihedral_angle_3_deg 14.893
r_dihedral_angle_2_deg 33.929
r_dihedral_angle_1_deg 5.27
r_angle_other_deg 0.75
r_angle_refined_deg 0.858
r_bond_other_d 0.001
r_bond_refined_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 19688
Nucleic Acid Atoms 0
Heterogen Atoms 70
Solvent Atoms 6

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
DENZO Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
PHASER Structure Solution
REFMAC 5.6.0117 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.6.0117 refinement
PHASER model building
HKL-2000 data collection