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X-RAY DIFFRACTION
Materials and Methods page
4GNI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 0.1 M HEPES, pH 7.5; 20 % PEG3350, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.63 α = 90
    b = 55.38 β = 106.53
    c = 98.79 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-02-04
     
    Diffraction Radiation
    Monochromator horizontally diffracting Si (111) monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-2
    Wavelength List 0.87
    Site ESRF
    Beamline ID23-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.8
    Resolution(Low) 36.07
    Number Reflections(Observed) 78273
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.104
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.796
    Resolution(Low) 1.89
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.796
    Resolution(Low) 36.066
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 0
    Number of Reflections(Observed) 74623
    Number of Reflections(R-Free) 1914
    Percent Reflections(Observed) 95.35
    R-Factor(Observed) 0.2021
    R-Work 0.201
    R-Free 0.2436
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.1323
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 5.5299
    Anisotropic B[2][2] -0.432
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.2997
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.796
    Shell Resolution(Low) 1.8602
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 6420
    R-Factor(R-Work) 0.3126
    R-Factor(R-Free) 0.3357
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8602
    Shell Resolution(Low) 1.9347
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 6732
    R-Factor(R-Work) 0.264
    R-Factor(R-Free) 0.2938
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9347
    Shell Resolution(Low) 2.0227
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 6974
    R-Factor(R-Work) 0.2276
    R-Factor(R-Free) 0.2561
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0227
    Shell Resolution(Low) 2.1293
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 7252
    R-Factor(R-Work) 0.209
    R-Factor(R-Free) 0.2576
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1293
    Shell Resolution(Low) 2.2627
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 7323
    R-Factor(R-Work) 0.1957
    R-Factor(R-Free) 0.2491
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2627
    Shell Resolution(Low) 2.4374
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 7426
    R-Factor(R-Work) 0.2045
    R-Factor(R-Free) 0.2617
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4374
    Shell Resolution(Low) 2.6826
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 7511
    R-Factor(R-Work) 0.2074
    R-Factor(R-Free) 0.2709
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6826
    Shell Resolution(Low) 3.0706
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 7594
    R-Factor(R-Work) 0.1986
    R-Factor(R-Free) 0.2472
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0706
    Shell Resolution(Low) 3.8679
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 7659
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2113
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8679
    Shell Resolution(Low) 36.0732
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 7818
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.217
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.065
    f_dihedral_angle_d 13.616
    f_angle_d 1.107
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5887
    Nucleic Acid Atoms 0
    Heterogen Atoms 64
    Solvent Atoms 832
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection ADSC version: Quantum