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X-RAY DIFFRACTION
Materials and Methods page
4GMQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 291.0
    Details 2.4 M ammonium sulfate, 0.1 M Tris, pH 7.5 , VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 29.88 α = 90
    b = 44.06 β = 90
    c = 66.62 γ = 90
     
    Space Group
    Space Group Name:    P 2 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-03-14
     
    Diffraction Radiation
    Monochromator Double crystal, Si(111) or Si(311)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength List 1.0665
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.3
    Resolution(Low) 27.26
    Number Reflections(Observed) 22243
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.064
    Redundancy 6.6
     
    High Resolution Shell Details
    Resolution(High) 1.3
    Resolution(Low) 1.37
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.296
    Mean I Over Sigma(Observed) 5.6
    Redundancy 6.7
    Number Unique Reflections(All) 3170
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method AB INITIO PHASING
    reflnsShellList 1.3
    Resolution(Low) 27.263
    Cut-off Sigma(F) 1.39
    Number of Reflections(all) 0
    Number of Reflections(Observed) 22198
    Number of Reflections(R-Free) 1121
    Percent Reflections(Observed) 99.52
    R-Factor(Observed) 0.1532
    R-Work 0.1514
    R-Free 0.188
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.405
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.9749
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.4301
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3
    Shell Resolution(Low) 1.3592
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.2338
    R-Factor(R-Free) 0.2784
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3592
    Shell Resolution(Low) 1.4308
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1552
    R-Factor(R-Free) 0.2072
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4308
    Shell Resolution(Low) 1.5205
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.117
    R-Factor(R-Free) 0.1452
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5205
    Shell Resolution(Low) 1.6378
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.1139
    R-Factor(R-Free) 0.1621
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6378
    Shell Resolution(Low) 1.8026
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.1245
    R-Factor(R-Free) 0.1684
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8026
    Shell Resolution(Low) 2.0634
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.1374
    R-Factor(R-Free) 0.2002
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0634
    Shell Resolution(Low) 2.5994
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1464
    R-Factor(R-Free) 0.1741
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5994
    Shell Resolution(Low) 27.2693
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.2005
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.06
    f_dihedral_angle_d 10.439
    f_angle_d 0.887
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 686
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 182
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution Acorn
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building Acorn
    data collection ADSC version: Quantum