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X-RAY DIFFRACTION
Materials and Methods page
4GLQ
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, sitting drop
    pH 5.5
    Temperature 293.0
    Details 50 mM NaCl, 0.3 mM tris(2-carboxyethyl)phosphine, 10 mM HEPES-NaOH (pH 7.8), 25% polyethylene glycol 3350, 200 mM sodium chloride, 40 mM glycine, 100 mM BIS-TRIS-HCl, (pH 5.5), vapor diffusion, sitting drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 47.04 α = 90
    b = 47.04 β = 90
    c = 125.97 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details mirrors
    Collection Date 2012-01-01
     
    Diffraction Radiation
    Diffraction Protocol Single wavelength
     
    Diffraction Source
    Source synchrotron
    Type APS BEAMLINE 21-ID-D
    Wavelength List 0.97895
    Site APS
    Beamline 21-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.77
    Resolution(Low) 50
    Number Reflections(All) 14559
    Number Reflections(Observed) 14530
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.069
    Redundancy 10.0
     
    High Resolution Shell Details
    Resolution(High) 1.77
    Resolution(Low) 1.8
    Percent Possible(All) 98.5
    R Merge I(Observed) 0.323
    Redundancy 9.5
    Number Unique Reflections(All) 699
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.772
    Resolution(Low) 44.068
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 14498
    Number of Reflections(Observed) 14336
    Number of Reflections(R-Free) 1437
    Percent Reflections(Observed) 98.88
    R-Factor(All) 0.159
    R-Factor(Observed) 0.159
    R-Work 0.1546
    R-Free 0.1996
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 34.2812
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7718
    Shell Resolution(Low) 1.8352
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1206
    R-Factor(R-Work) 0.1646
    R-Factor(R-Free) 0.2259
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8352
    Shell Resolution(Low) 1.9086
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1227
    R-Factor(R-Work) 0.1587
    R-Factor(R-Free) 0.2188
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9086
    Shell Resolution(Low) 1.9955
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1257
    R-Factor(R-Work) 0.146
    R-Factor(R-Free) 0.1876
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9955
    Shell Resolution(Low) 2.1007
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1270
    R-Factor(R-Work) 0.1456
    R-Factor(R-Free) 0.2078
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1007
    Shell Resolution(Low) 2.2323
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1282
    R-Factor(R-Work) 0.1413
    R-Factor(R-Free) 0.1905
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2323
    Shell Resolution(Low) 2.4047
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1270
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.2203
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4047
    Shell Resolution(Low) 2.6466
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1299
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.2091
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6466
    Shell Resolution(Low) 3.0295
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1312
    R-Factor(R-Work) 0.17
    R-Factor(R-Free) 0.1986
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0295
    Shell Resolution(Low) 3.8166
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1333
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.191
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8166
    Shell Resolution(Low) 44.0812
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1443
    R-Factor(R-Work) 0.1559
    R-Factor(R-Free) 0.1916
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 17.122
    f_plane_restr 0.005
    f_chiral_restr 0.083
    f_angle_d 1.264
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1201
    Nucleic Acid Atoms 0
    Heterogen Atoms 43
    Solvent Atoms 137
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser version: 2.5.0
    data reduction HKL