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X-RAY DIFFRACTION
Materials and Methods page
4GL2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 71.11 α = 90
    b = 154.75 β = 90
    c = 185.01 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type PSI PILATUS 6M
    Collection Date 2012-04-20
     
    Diffraction Radiation
    Monochromator Kohzu HLD8-24
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.97950
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.56
    Resolution(Low) 118.7
    Number Reflections(All) 25225
    Number Reflections(Observed) 24216
    Percent Possible(Observed) 96.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.557
    Resolution(Low) 118.699
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 25225
    Number of Reflections(Observed) 24044
    Number of Reflections(R-Free) 1204
    Percent Reflections(Observed) 95.1
    R-Factor(Observed) 0.2782
    R-Work 0.2761
    R-Free 0.32
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.557
    Shell Resolution(Low) 3.6994
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.3568
    R-Factor(R-Free) 0.4334
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6994
    Shell Resolution(Low) 3.8678
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2510
    R-Factor(R-Work) 0.3274
    R-Factor(R-Free) 0.3154
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8678
    Shell Resolution(Low) 4.0718
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2486
    R-Factor(R-Work) 0.3039
    R-Factor(R-Free) 0.336
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0718
    Shell Resolution(Low) 4.3269
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2521
    R-Factor(R-Work) 0.2882
    R-Factor(R-Free) 0.3683
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3269
    Shell Resolution(Low) 4.661
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.252
    R-Factor(R-Free) 0.3119
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.661
    Shell Resolution(Low) 5.13
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.2469
    R-Factor(R-Free) 0.2981
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.13
    Shell Resolution(Low) 5.8723
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2523
    R-Factor(R-Work) 0.2952
    R-Factor(R-Free) 0.358
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8723
    Shell Resolution(Low) 7.3984
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.2803
    R-Factor(R-Free) 0.3142
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.3984
    Shell Resolution(Low) 118.765
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.2279
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.063
    f_dihedral_angle_d 16.721
    f_angle_d 1.273
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9651
    Nucleic Acid Atoms 1020
    Heterogen Atoms 64
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection APS in house software
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALA
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASES
    data collection APS version: in house software