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X-RAY DIFFRACTION
Materials and Methods page
4GKU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 6.5
    Temperature 293.0
    Details 0.2M magnesium chloride, 0.1M BIS-Tris, 25% PEG 3350, pH 6.5, VAPOR DIFFUSION, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 47.01 α = 90
    b = 72.82 β = 90
    c = 74.72 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2010-07-25
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BSRF BEAMLINE 3W1A
    Wavelength List 1.2605
    Site BSRF
    Beamline 3W1A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.3
    Observed Criterion Sigma(I) 100.8
    Resolution(High) 1.91
    Resolution(Low) 50
    Number Reflections(All) 37743
    Number Reflections(Observed) 37743
    Percent Possible(Observed) 98.1
    Redundancy 13.1
     
    High Resolution Shell Details
    Resolution(High) 1.91
    Resolution(Low) 1.98
    Percent Possible(All) 89.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.915
    Resolution(Low) 34.917
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 37743
    Number of Reflections(Observed) 36758
    Number of Reflections(R-Free) 3600
    Percent Reflections(Observed) 96.33
    R-Factor(Observed) 0.1664
    R-Work 0.1631
    R-Free 0.1969
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.9168
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.1581
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.7588
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9147
    Shell Resolution(Low) 1.9831
    Number of Reflections(R-Free) 295
    Number of Reflections(R-Work) 3017
    R-Factor(R-Work) 0.2222
    R-Factor(R-Free) 0.2914
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9831
    Shell Resolution(Low) 2.0625
    Number of Reflections(R-Free) 369
    Number of Reflections(R-Work) 3236
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.2017
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0625
    Shell Resolution(Low) 2.1564
    Number of Reflections(R-Free) 351
    Number of Reflections(R-Work) 3332
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.2036
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1564
    Shell Resolution(Low) 2.27
    Number of Reflections(R-Free) 373
    Number of Reflections(R-Work) 3336
    R-Factor(R-Work) 0.1414
    R-Factor(R-Free) 0.1646
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.27
    Shell Resolution(Low) 2.4122
    Number of Reflections(R-Free) 348
    Number of Reflections(R-Work) 3291
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.2084
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4122
    Shell Resolution(Low) 2.5984
    Number of Reflections(R-Free) 393
    Number of Reflections(R-Work) 3348
    R-Factor(R-Work) 0.1608
    R-Factor(R-Free) 0.1904
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5984
    Shell Resolution(Low) 2.8598
    Number of Reflections(R-Free) 370
    Number of Reflections(R-Work) 3346
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.1988
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8598
    Shell Resolution(Low) 3.2733
    Number of Reflections(R-Free) 362
    Number of Reflections(R-Work) 3395
    R-Factor(R-Work) 0.1728
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2733
    Shell Resolution(Low) 4.123
    Number of Reflections(R-Free) 370
    Number of Reflections(R-Work) 3429
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.1737
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.123
    Shell Resolution(Low) 34.9227
    Number of Reflections(R-Free) 369
    Number of Reflections(R-Work) 3428
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.1975
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_dihedral_angle_d 13.739
    f_angle_d 1.016
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2026
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 315
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASES
    data collection HKL-2000