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X-RAY DIFFRACTION
Materials and Methods page
4GK8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 293.0
    Details 25% SODIUM CHLORIDE, 0.1M IMIDAZOLE, 0.5 mM Zinc Chloride, 100 mM sodium arsenate, 50mM L-histidinol.HCl PH 8.0, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 85.86 α = 90
    b = 86.62 β = 90
    c = 45.09 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-06-17
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.93
    Resolution(Low) 43.31
    Number Reflections(All) 25741
    Number Reflections(Observed) 25741
    Percent Possible(Observed) 99.36
    B(Isotropic) From Wilson Plot 14.93
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.933
    Resolution(Low) 43.311
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 25741
    Number of Reflections(Observed) 25741
    Number of Reflections(R-Free) 1314
    Percent Reflections(Observed) 99.36
    R-Factor(All) 0.1633
    R-Factor(Observed) 0.1633
    R-Work 0.1616
    R-Free 0.1955
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9329
    Shell Resolution(Low) 2.0103
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2513
    R-Factor(R-Work) 0.181
    R-Factor(R-Free) 0.2174
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0103
    Shell Resolution(Low) 2.1018
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1666
    R-Factor(R-Free) 0.2201
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1018
    Shell Resolution(Low) 2.2126
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.1552
    R-Factor(R-Free) 0.1907
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2126
    Shell Resolution(Low) 2.3512
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1644
    R-Factor(R-Free) 0.2389
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3512
    Shell Resolution(Low) 2.5327
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1667
    R-Factor(R-Free) 0.1916
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5327
    Shell Resolution(Low) 2.7875
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7875
    Shell Resolution(Low) 3.1908
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2051
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1908
    Shell Resolution(Low) 4.0196
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2767
    R-Factor(R-Work) 0.1493
    R-Factor(R-Free) 0.1756
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0196
    Shell Resolution(Low) 43.3219
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2911
    R-Factor(R-Work) 0.1456
    R-Factor(R-Free) 0.1655
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 15.714
    f_angle_d 1.082
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2173
    Nucleic Acid Atoms 0
    Heterogen Atoms 33
    Solvent Atoms 181
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHENIX
    data collection HKL-2000