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X-RAY DIFFRACTION
Materials and Methods page
4GK3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.1M sodium cacodylate pH 6.5, 0.15M ammonium sulf ate, 22.5% PEG 3350 , VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 53.3 α = 90
    b = 38.25 β = 101.72
    c = 76.05 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 345 mm plate
    Collection Date 2011-03-30
     
    Diffraction Radiation
    Monochromator Goebel Mirror
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SEALED TUBE
    Type BRUKER AXS MICROSTAR
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.0
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.9
    Resolution(Low) 34.02
    Number Reflections(All) 24109
    Number Reflections(Observed) 23747
    Percent Possible(Observed) 98.5
    R Merge I(Observed) 0.084
    B(Isotropic) From Wilson Plot 19.888
    Redundancy 3.0
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.0
    Percent Possible(All) 94.8
    R Merge I(Observed) 0.405
    Mean I Over Sigma(Observed) 2.8
    Redundancy 2.9
    Number Unique Reflections(All) 3478
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.898
    Resolution(Low) 30.851
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 24098
    Number of Reflections(Observed) 23736
    Number of Reflections(R-Free) 1206
    Percent Reflections(Observed) 98.5
    R-Factor(Observed) 0.1796
    R-Work 0.1778
    R-Free 0.2128
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.984
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -4.6329
    Anisotropic B[2][2] -0.3574
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.6267
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8983
    Shell Resolution(Low) 1.9743
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2349
    R-Factor(R-Work) 0.237
    R-Factor(R-Free) 0.2952
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9743
    Shell Resolution(Low) 2.0641
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2511
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0641
    Shell Resolution(Low) 2.1729
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2496
    R-Factor(R-Work) 0.1749
    R-Factor(R-Free) 0.2337
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1729
    Shell Resolution(Low) 2.309
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2155
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.309
    Shell Resolution(Low) 2.4872
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2526
    R-Factor(R-Work) 0.178
    R-Factor(R-Free) 0.2199
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4872
    Shell Resolution(Low) 2.7374
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2532
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7374
    Shell Resolution(Low) 3.1332
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2508
    R-Factor(R-Work) 0.1777
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1332
    Shell Resolution(Low) 3.9462
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2531
    R-Factor(R-Work) 0.1674
    R-Factor(R-Free) 0.1842
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9462
    Shell Resolution(Low) 30.8548
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_dihedral_angle_d 12.903
    f_angle_d 1.377
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2168
    Nucleic Acid Atoms 0
    Heterogen Atoms 26
    Solvent Atoms 218
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building Phaser
    data collection XDS