X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 293.0
Details 0.1M sodium cacodylate pH 6.5, 0.15M ammonium sulf ate, 22.5% PEG 3350 , VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 53.3 α = 90
b = 38.25 β = 101.72
c = 76.05 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR scanner 345 mm plate -- 2011-03-30
Diffraction Radiation
Monochromator Protocol
Goebel Mirror SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SEALED TUBE BRUKER AXS MICROSTAR 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 34.02 98.5 0.084 -- -- 3.0 24109 23747 3.0 3.0 19.888
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 2.0 94.8 0.405 -- 2.8 2.9 3478

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.898 30.851 -- 1.34 24098 23736 1206 98.5 -- 0.1796 0.1778 0.2128 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8983 1.9743 -- 122 2349 0.237 0.2952 -- 93.0
X Ray Diffraction 1.9743 2.0641 -- 128 2511 0.1834 0.2122 -- 100.0
X Ray Diffraction 2.0641 2.1729 -- 129 2496 0.1749 0.2337 -- 100.0
X Ray Diffraction 2.1729 2.309 -- 137 2529 0.1805 0.2155 -- 100.0
X Ray Diffraction 2.309 2.4872 -- 118 2526 0.178 0.2199 -- 100.0
X Ray Diffraction 2.4872 2.7374 -- 144 2532 0.1861 0.2264 -- 100.0
X Ray Diffraction 2.7374 3.1332 -- 156 2508 0.1777 0.2327 -- 100.0
X Ray Diffraction 3.1332 3.9462 -- 136 2531 0.1674 0.1842 -- 100.0
X Ray Diffraction 3.9462 30.8548 -- 136 2548 0.1713 0.1979 -- 96.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 2.984
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -4.6329
Anisotropic B[2][2] -0.3574
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.6267
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.067
f_dihedral_angle_d 12.903
f_angle_d 1.377
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2168
Nucleic Acid Atoms 0
Heterogen Atoms 26
Solvent Atoms 218

Software

Computing
Computing Package Purpose
XDS Data Collection
XDS Data Reduction (intensity integration)
SCALA Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
Phaser model building
XDS data collection