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X-RAY DIFFRACTION
Materials and Methods page
4GIN
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 292.0
    Details 0.1M Tris-HCl, 12%(w/v) PEG20000, 0.01M L-Cysteine, pH 8, VAPOR DIFFUSION, HANGING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 83.8 α = 90
    b = 89.7 β = 90
    c = 91.6 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2004-07-03
     
    Diffraction Radiation
    Monochromator YALE MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM30A
    Wavelength List 0.9699
    Site ESRF
    Beamline BM30A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.9
    Resolution(Low) 44.85
    Number Reflections(All) 55036
    Number Reflections(Observed) 55036
    Percent Possible(Observed) 99.9
    Redundancy 4.9
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.02
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.271
    Mean I Over Sigma(Observed) 5.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 44.85
    Cut-off Sigma(F) 1.39
    Number of Reflections(all) 55017
    Number of Reflections(Observed) 55017
    Number of Reflections(R-Free) 5580
    Percent Reflections(Observed) 99.9
    R-Factor(Observed) 0.144
    R-Work 0.1399
    R-Free 0.1806
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9216
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 1638
    R-Factor(R-Work) 0.1894
    R-Factor(R-Free) 0.2414
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9216
    Shell Resolution(Low) 1.9442
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 1618
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.203
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9442
    Shell Resolution(Low) 1.9679
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 1599
    R-Factor(R-Work) 0.155
    R-Factor(R-Free) 0.1974
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9679
    Shell Resolution(Low) 1.9928
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 1629
    R-Factor(R-Work) 0.1499
    R-Factor(R-Free) 0.1951
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9928
    Shell Resolution(Low) 2.0191
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 1615
    R-Factor(R-Work) 0.1495
    R-Factor(R-Free) 0.2095
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0191
    Shell Resolution(Low) 2.0467
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 1662
    R-Factor(R-Work) 0.1508
    R-Factor(R-Free) 0.1978
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0467
    Shell Resolution(Low) 2.076
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 1615
    R-Factor(R-Work) 0.1501
    R-Factor(R-Free) 0.193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.076
    Shell Resolution(Low) 2.1069
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1638
    R-Factor(R-Work) 0.1485
    R-Factor(R-Free) 0.1925
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1069
    Shell Resolution(Low) 2.1399
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 1622
    R-Factor(R-Work) 0.1368
    R-Factor(R-Free) 0.1887
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1399
    Shell Resolution(Low) 2.1749
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 1648
    R-Factor(R-Work) 0.14
    R-Factor(R-Free) 0.1915
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1749
    Shell Resolution(Low) 2.2124
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 1630
    R-Factor(R-Work) 0.1437
    R-Factor(R-Free) 0.1831
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2124
    Shell Resolution(Low) 2.2527
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 1613
    R-Factor(R-Work) 0.1451
    R-Factor(R-Free) 0.2035
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2527
    Shell Resolution(Low) 2.296
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 1670
    R-Factor(R-Work) 0.1408
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.296
    Shell Resolution(Low) 2.3429
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 1612
    R-Factor(R-Work) 0.1338
    R-Factor(R-Free) 0.1681
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3429
    Shell Resolution(Low) 2.3938
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 1636
    R-Factor(R-Work) 0.1329
    R-Factor(R-Free) 0.17
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3938
    Shell Resolution(Low) 2.4495
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 1619
    R-Factor(R-Work) 0.1384
    R-Factor(R-Free) 0.1937
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4495
    Shell Resolution(Low) 2.5107
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 1645
    R-Factor(R-Work) 0.1294
    R-Factor(R-Free) 0.1978
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5107
    Shell Resolution(Low) 2.5786
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 1622
    R-Factor(R-Work) 0.1374
    R-Factor(R-Free) 0.1764
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5786
    Shell Resolution(Low) 2.6545
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 1651
    R-Factor(R-Work) 0.1353
    R-Factor(R-Free) 0.1684
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6545
    Shell Resolution(Low) 2.7402
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 1655
    R-Factor(R-Work) 0.1365
    R-Factor(R-Free) 0.1737
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7402
    Shell Resolution(Low) 2.8381
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 1650
    R-Factor(R-Work) 0.1419
    R-Factor(R-Free) 0.1792
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8381
    Shell Resolution(Low) 2.9517
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 1628
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.1945
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9517
    Shell Resolution(Low) 3.086
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 1665
    R-Factor(R-Work) 0.146
    R-Factor(R-Free) 0.1889
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.086
    Shell Resolution(Low) 3.2486
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 1657
    R-Factor(R-Work) 0.1436
    R-Factor(R-Free) 0.196
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2486
    Shell Resolution(Low) 3.4521
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 1668
    R-Factor(R-Work) 0.1389
    R-Factor(R-Free) 0.1842
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4521
    Shell Resolution(Low) 3.7185
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 1649
    R-Factor(R-Work) 0.1315
    R-Factor(R-Free) 0.1486
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7185
    Shell Resolution(Low) 4.0925
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1708
    R-Factor(R-Work) 0.1219
    R-Factor(R-Free) 0.1595
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0925
    Shell Resolution(Low) 4.6842
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 1690
    R-Factor(R-Work) 0.1155
    R-Factor(R-Free) 0.1519
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6842
    Shell Resolution(Low) 5.8994
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 1704
    R-Factor(R-Work) 0.1314
    R-Factor(R-Free) 0.1616
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8994
    Shell Resolution(Low) 44.8625
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 1781
    R-Factor(R-Work) 0.168
    R-Factor(R-Free) 0.1791
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.085
    f_dihedral_angle_d 12.743
    f_angle_d 1.095
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4453
    Nucleic Acid Atoms 0
    Heterogen Atoms 25
    Solvent Atoms 716
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building AMoRE
    data collection ADSC version: Quantum