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X-RAY DIFFRACTION
Materials and Methods page
4GH5
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 277.0
    Details 0.35M ammonium acetate, 27% polyethylene glycol, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 116.07 α = 90
    b = 127.92 β = 90
    c = 58.45 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 80
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details mirrors
    Collection Date 2010-09-02
     
    Diffraction Radiation
    Monochromator Ni filter
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RU200
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.6
    Resolution(Low) 35
    Number Reflections(All) 113574
    Number Reflections(Observed) 113574
    Percent Possible(Observed) 16.0
    R Merge I(Observed) 0.063
    Redundancy 6.2
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.66
    Percent Possible(All) 86.0
    R Merge I(Observed) 0.444
    Mean I Over Sigma(Observed) 1.92
    R-Sym I(Observed) 0.423
    Redundancy 2.8
    Number Unique Reflections(All) 9812
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6
    Resolution(Low) 26.425
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 113447
    Number of Reflections(Observed) 113447
    Number of Reflections(R-Free) 5687
    Percent Reflections(Observed) 98.22
    R-Factor(All) 0.1722
    R-Factor(Observed) 0.1722
    R-Work 0.1708
    R-Free 0.1986
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 13.77
    Anisotropic B[1][1] -1.1666
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.2878
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.8788
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6
    Shell Resolution(Low) 1.6174
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2832
    R-Factor(R-Work) 0.5487
    R-Factor(R-Free) 0.5619
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6174
    Shell Resolution(Low) 1.6364
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3103
    R-Factor(R-Work) 0.479
    R-Factor(R-Free) 0.5226
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6364
    Shell Resolution(Low) 1.6563
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3296
    R-Factor(R-Work) 0.4207
    R-Factor(R-Free) 0.4523
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6563
    Shell Resolution(Low) 1.6773
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3428
    R-Factor(R-Work) 0.3224
    R-Factor(R-Free) 0.366
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6773
    Shell Resolution(Low) 1.6994
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3542
    R-Factor(R-Work) 0.2564
    R-Factor(R-Free) 0.3278
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6994
    Shell Resolution(Low) 1.7226
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3588
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2066
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7226
    Shell Resolution(Low) 1.7472
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3566
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7472
    Shell Resolution(Low) 1.7733
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3647
    R-Factor(R-Work) 0.1536
    R-Factor(R-Free) 0.2032
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7733
    Shell Resolution(Low) 1.801
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3604
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.196
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.801
    Shell Resolution(Low) 1.8305
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3651
    R-Factor(R-Work) 0.1327
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8305
    Shell Resolution(Low) 1.8621
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3607
    R-Factor(R-Work) 0.1387
    R-Factor(R-Free) 0.2033
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8621
    Shell Resolution(Low) 1.896
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3663
    R-Factor(R-Work) 0.1407
    R-Factor(R-Free) 0.1825
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.896
    Shell Resolution(Low) 1.9324
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3625
    R-Factor(R-Work) 0.1475
    R-Factor(R-Free) 0.2124
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9324
    Shell Resolution(Low) 1.9718
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3632
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9718
    Shell Resolution(Low) 2.0147
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3646
    R-Factor(R-Work) 0.1659
    R-Factor(R-Free) 0.2071
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0147
    Shell Resolution(Low) 2.0615
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3628
    R-Factor(R-Work) 0.1662
    R-Factor(R-Free) 0.1929
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0615
    Shell Resolution(Low) 2.1131
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3629
    R-Factor(R-Work) 0.1601
    R-Factor(R-Free) 0.1775
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1131
    Shell Resolution(Low) 2.1702
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3673
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.1779
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1702
    Shell Resolution(Low) 2.234
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3638
    R-Factor(R-Work) 0.1512
    R-Factor(R-Free) 0.1794
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.234
    Shell Resolution(Low) 2.3061
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3656
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.1732
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3061
    Shell Resolution(Low) 2.3885
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3638
    R-Factor(R-Work) 0.1529
    R-Factor(R-Free) 0.1612
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3885
    Shell Resolution(Low) 2.484
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3661
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.1951
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.484
    Shell Resolution(Low) 2.597
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3686
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.1941
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.597
    Shell Resolution(Low) 2.7338
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3640
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.1964
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7338
    Shell Resolution(Low) 2.9048
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3692
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.2184
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9048
    Shell Resolution(Low) 3.1288
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3690
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.1908
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1288
    Shell Resolution(Low) 3.4431
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3713
    R-Factor(R-Work) 0.1587
    R-Factor(R-Free) 0.1652
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4431
    Shell Resolution(Low) 3.9399
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3713
    R-Factor(R-Work) 0.1552
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9399
    Shell Resolution(Low) 4.9584
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3767
    R-Factor(R-Work) 0.1406
    R-Factor(R-Free) 0.1563
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9584
    Shell Resolution(Low) 26.425
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3906
    R-Factor(R-Work) 0.1871
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 15.754
    f_angle_d 1.152
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6895
    Nucleic Acid Atoms 0
    Heterogen Atoms 192
    Solvent Atoms 1027
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building Phaser
    data collection CrystalClear