X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 9.5
Temperature 293.0
Details PEG 8000, NaCl, Ches, pH 9.5, VAPOR DIFFUSION, HANGING DROP, temperature 293 K, temperature 293.K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 46.29 α = 90
b = 50.2 β = 90
c = 85.88 γ = 90
Symmetry
Space Group P 21 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 113
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ Osmic mirrors --
Diffraction Radiation
Monochromator Protocol
Graphite SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 26.67 91.5 -- -- -- -- 14056 13543 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.03 94.2 -- -- -- 5.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.998 26.669 -- 0.0 14056 -- 1358 96.78 0.1778 0.1778 0.1727 0.2243 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9984 2.0698 -- 113 1069 0.2484 0.3053 -- 87.0
X Ray Diffraction 2.0698 2.1526 -- 134 1175 0.2099 0.2597 -- 95.0
X Ray Diffraction 2.1526 2.2506 -- 136 1188 0.1778 0.2811 -- 96.0
X Ray Diffraction 2.2506 2.3692 -- 139 1212 0.1796 0.254 -- 97.0
X Ray Diffraction 2.3692 2.5175 -- 132 1236 0.1765 0.2361 -- 98.0
X Ray Diffraction 2.5175 2.7117 -- 136 1225 0.1757 0.2214 -- 98.0
X Ray Diffraction 2.7117 2.9842 -- 138 1253 0.1769 0.2245 -- 99.0
X Ray Diffraction 2.9842 3.4153 -- 146 1270 0.1813 0.2222 -- 100.0
X Ray Diffraction 3.4153 4.3 -- 142 1284 0.1551 0.2122 -- 100.0
X Ray Diffraction 4.3 26.6714 -- 142 1381 0.1583 0.1917 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 5.4294
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -6.6904
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.261
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.057
f_dihedral_angle_d 13.997
f_angle_d 0.803
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1448
Nucleic Acid Atoms 0
Heterogen Atoms 4
Solvent Atoms 113

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phenix Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
Phenix model building
HKL-2000 data collection