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X-RAY DIFFRACTION
Materials and Methods page
4GGG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 9.5
    Temperature 293.0
    Details PEG 8000, NaCl, Ches, pH 9.5, VAPOR DIFFUSION, HANGING DROP, temperature 293 K, temperature 293.K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 46.29 α = 90
    b = 50.2 β = 90
    c = 85.88 γ = 90
     
    Space Group
    Space Group Name:    P 21 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 113
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details Osmic mirrors
     
    Diffraction Radiation
    Monochromator Graphite
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH3R
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2
    Resolution(Low) 26.67
    Number Reflections(All) 14056
    Number Reflections(Observed) 13543
    Percent Possible(Observed) 91.5
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.03
    Percent Possible(All) 94.2
    Redundancy 5.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.998
    Resolution(Low) 26.669
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 14056
    Number of Reflections(R-Free) 1358
    Percent Reflections(Observed) 96.78
    R-Factor(All) 0.1778
    R-Factor(Observed) 0.1778
    R-Work 0.1727
    R-Free 0.2243
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.4294
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -6.6904
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.261
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9984
    Shell Resolution(Low) 2.0698
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 1069
    R-Factor(R-Work) 0.2484
    R-Factor(R-Free) 0.3053
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0698
    Shell Resolution(Low) 2.1526
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1175
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.2597
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1526
    Shell Resolution(Low) 2.2506
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1188
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2811
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2506
    Shell Resolution(Low) 2.3692
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1212
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.254
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3692
    Shell Resolution(Low) 2.5175
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1236
    R-Factor(R-Work) 0.1765
    R-Factor(R-Free) 0.2361
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5175
    Shell Resolution(Low) 2.7117
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1225
    R-Factor(R-Work) 0.1757
    R-Factor(R-Free) 0.2214
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7117
    Shell Resolution(Low) 2.9842
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1253
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.2245
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9842
    Shell Resolution(Low) 3.4153
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1270
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2222
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4153
    Shell Resolution(Low) 4.3
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1284
    R-Factor(R-Work) 0.1551
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3
    Shell Resolution(Low) 26.6714
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1381
    R-Factor(R-Work) 0.1583
    R-Factor(R-Free) 0.1917
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.057
    f_dihedral_angle_d 13.997
    f_angle_d 0.803
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1448
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 113
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phenix
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building Phenix
    data collection HKL-2000