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X-RAY DIFFRACTION
Materials and Methods page
4GFH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 291.0
    Details 23% PEG 300, 100 mM Tris (8.0), VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 169.13 α = 90
    b = 169.88 β = 90
    c = 169.21 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-08-21
     
    Diffraction Radiation
    Monochromator DOUBLE FLAT CRYSTAL, SI (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 1.1159
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 4.41
    Resolution(Low) 50
    Number Reflections(All) 28660
    Number Reflections(Observed) 28660
    Percent Possible(Observed) 91.7
     
    High Resolution Shell Details
    Resolution(High) 4.408
    Resolution(Low) 4.57
    Percent Possible(All) 92.9
    Mean I Over Sigma(Observed) 2.0
    R-Sym I(Observed) 0.703
    Redundancy 4.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 4.408
    Resolution(Low) 46.988
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 28660
    Number of Reflections(Observed) 28660
    Number of Reflections(R-Free) 1450
    Percent Reflections(Observed) 91.22
    R-Factor(Observed) 0.241
    R-Work 0.2391
    R-Free 0.2754
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -8.3384
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.357
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.9815
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.408
    Shell Resolution(Low) 4.5652
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.3696
    R-Factor(R-Free) 0.4217
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5652
    Shell Resolution(Low) 4.7478
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.3309
    R-Factor(R-Free) 0.3739
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7478
    Shell Resolution(Low) 4.9637
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.2966
    R-Factor(R-Free) 0.3303
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9637
    Shell Resolution(Low) 5.2251
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2817
    R-Factor(R-Free) 0.3313
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2251
    Shell Resolution(Low) 5.5519
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2749
    R-Factor(R-Work) 0.2655
    R-Factor(R-Free) 0.3267
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5519
    Shell Resolution(Low) 5.9798
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.2719
    R-Factor(R-Free) 0.3473
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9798
    Shell Resolution(Low) 6.5801
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.2672
    R-Factor(R-Free) 0.3371
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5801
    Shell Resolution(Low) 7.5289
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.2231
    R-Factor(R-Free) 0.2462
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.5289
    Shell Resolution(Low) 9.4729
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.2439
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.4729
    Shell Resolution(Low) 46.988
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2759
    R-Factor(R-Work) 0.2074
    R-Factor(R-Free) 0.2221
    Percent Reflections(Observed) 88.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.054
    f_dihedral_angle_d 15.794
    f_angle_d 0.842
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 18054
    Nucleic Acid Atoms 2118
    Heterogen Atoms 64
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection ADSC version: Quantum