X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 291.0
Details 23% PEG 300, 100 mM Tris (8.0), VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 169.13 α = 90
b = 169.88 β = 90
c = 169.21 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2010-08-21
Diffraction Radiation
Monochromator Protocol
DOUBLE FLAT CRYSTAL, SI (111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.1159 ALS 8.3.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
4.41 50 91.7 -- -- -- -- 28660 28660 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
4.408 4.57 92.9 -- 0.703 2.0 4.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 4.408 46.988 -- 1.33 28660 28660 1450 91.22 -- 0.241 0.2391 0.2754 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 4.408 4.5652 -- 118 2690 0.3696 0.4217 -- 90.0
X Ray Diffraction 4.5652 4.7478 -- 141 2707 0.3309 0.3739 -- 93.0
X Ray Diffraction 4.7478 4.9637 -- 148 2718 0.2966 0.3303 -- 92.0
X Ray Diffraction 4.9637 5.2251 -- 145 2722 0.2817 0.3313 -- 93.0
X Ray Diffraction 5.2251 5.5519 -- 142 2749 0.2655 0.3267 -- 92.0
X Ray Diffraction 5.5519 5.9798 -- 146 2738 0.2719 0.3473 -- 92.0
X Ray Diffraction 5.9798 6.5801 -- 144 2692 0.2672 0.3371 -- 91.0
X Ray Diffraction 6.5801 7.5289 -- 165 2690 0.2231 0.2462 -- 90.0
X Ray Diffraction 7.5289 9.4729 -- 147 2745 0.1806 0.2439 -- 91.0
X Ray Diffraction 9.4729 46.988 -- 154 2759 0.2074 0.2221 -- 88.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -8.3384
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.357
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 5.9815
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.054
f_bond_d 0.004
f_dihedral_angle_d 15.794
f_angle_d 0.842
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 18054
Nucleic Acid Atoms 2118
Heterogen Atoms 64
Solvent Atoms 0

Software

Software
Software Name Purpose
ADSC data collection version: Quantum
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.7.3_928)
HKL-2000 data reduction
HKL-2000 data scaling