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X-RAY DIFFRACTION
Materials and Methods page
4GE8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 277.0
    Details 0.2M MgCl2, 35%peg400, 0.1M NaHepes, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 140.93 α = 90
    b = 140.93 β = 90
    c = 42.48 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2011-08-05
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength List 0.9795
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.45
    Resolution(Low) 28.6
    Number Reflections(Observed) 68916
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.048
    B(Isotropic) From Wilson Plot 20.45
    Redundancy 11.1
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.55
    Percent Possible(All) 98.0
    R Merge I(Observed) 0.63
    Mean I Over Sigma(Observed) 2.78
    Redundancy 10.4
    Number Unique Reflections(All) 6767
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.499
    Resolution(Low) 24.169
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 68913
    Number of Reflections(R-Free) 6891
    Percent Reflections(Observed) 99.75
    R-Factor(Observed) 0.1399
    R-Work 0.1365
    R-Free 0.1698
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.499
    Shell Resolution(Low) 1.5159
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 2026
    R-Factor(R-Work) 0.2125
    R-Factor(R-Free) 0.2846
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5159
    Shell Resolution(Low) 1.5337
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 2022
    R-Factor(R-Work) 0.1815
    R-Factor(R-Free) 0.2109
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5337
    Shell Resolution(Low) 1.5524
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 2033
    R-Factor(R-Work) 0.1535
    R-Factor(R-Free) 0.2056
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5524
    Shell Resolution(Low) 1.5721
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 2024
    R-Factor(R-Work) 0.1526
    R-Factor(R-Free) 0.2131
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5721
    Shell Resolution(Low) 1.5928
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 2034
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.2243
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5928
    Shell Resolution(Low) 1.6146
    Number of Reflections(R-Free) 229
    Number of Reflections(R-Work) 2052
    R-Factor(R-Work) 0.1426
    R-Factor(R-Free) 0.1871
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6146
    Shell Resolution(Low) 1.6376
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 2045
    R-Factor(R-Work) 0.1393
    R-Factor(R-Free) 0.2134
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6376
    Shell Resolution(Low) 1.6621
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 2013
    R-Factor(R-Work) 0.1398
    R-Factor(R-Free) 0.2022
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6621
    Shell Resolution(Low) 1.688
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 2058
    R-Factor(R-Work) 0.1337
    R-Factor(R-Free) 0.1804
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.688
    Shell Resolution(Low) 1.7157
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 2035
    R-Factor(R-Work) 0.1217
    R-Factor(R-Free) 0.1982
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7157
    Shell Resolution(Low) 1.7453
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 2043
    R-Factor(R-Work) 0.1218
    R-Factor(R-Free) 0.1709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7453
    Shell Resolution(Low) 1.777
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2073
    R-Factor(R-Work) 0.1253
    R-Factor(R-Free) 0.187
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.777
    Shell Resolution(Low) 1.8112
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 2028
    R-Factor(R-Work) 0.119
    R-Factor(R-Free) 0.1724
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8112
    Shell Resolution(Low) 1.8481
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 2081
    R-Factor(R-Work) 0.1186
    R-Factor(R-Free) 0.1689
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8481
    Shell Resolution(Low) 1.8883
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 2033
    R-Factor(R-Work) 0.113
    R-Factor(R-Free) 0.1662
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8883
    Shell Resolution(Low) 1.9322
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 2075
    R-Factor(R-Work) 0.1192
    R-Factor(R-Free) 0.1767
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9322
    Shell Resolution(Low) 1.9805
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 2041
    R-Factor(R-Work) 0.1175
    R-Factor(R-Free) 0.1466
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9805
    Shell Resolution(Low) 2.034
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2077
    R-Factor(R-Work) 0.1099
    R-Factor(R-Free) 0.1453
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.034
    Shell Resolution(Low) 2.0939
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 2042
    R-Factor(R-Work) 0.1134
    R-Factor(R-Free) 0.155
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0939
    Shell Resolution(Low) 2.1614
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2075
    R-Factor(R-Work) 0.1154
    R-Factor(R-Free) 0.1655
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1614
    Shell Resolution(Low) 2.2386
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 2102
    R-Factor(R-Work) 0.1189
    R-Factor(R-Free) 0.152
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2386
    Shell Resolution(Low) 2.3282
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 2040
    R-Factor(R-Work) 0.1153
    R-Factor(R-Free) 0.1731
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3282
    Shell Resolution(Low) 2.434
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2072
    R-Factor(R-Work) 0.1238
    R-Factor(R-Free) 0.1647
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.434
    Shell Resolution(Low) 2.5622
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 2082
    R-Factor(R-Work) 0.1263
    R-Factor(R-Free) 0.1723
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5622
    Shell Resolution(Low) 2.7225
    Number of Reflections(R-Free) 233
    Number of Reflections(R-Work) 2103
    R-Factor(R-Work) 0.1263
    R-Factor(R-Free) 0.1708
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7225
    Shell Resolution(Low) 2.9324
    Number of Reflections(R-Free) 233
    Number of Reflections(R-Work) 2090
    R-Factor(R-Work) 0.1328
    R-Factor(R-Free) 0.1723
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9324
    Shell Resolution(Low) 3.2269
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 2132
    R-Factor(R-Work) 0.1426
    R-Factor(R-Free) 0.1738
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2269
    Shell Resolution(Low) 3.6924
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 2114
    R-Factor(R-Work) 0.1403
    R-Factor(R-Free) 0.1552
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6924
    Shell Resolution(Low) 4.6466
    Number of Reflections(R-Free) 240
    Number of Reflections(R-Work) 2157
    R-Factor(R-Work) 0.131
    R-Factor(R-Free) 0.1537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6466
    Shell Resolution(Low) 24.1721
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 2220
    R-Factor(R-Work) 0.1963
    R-Factor(R-Free) 0.184
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.078
    f_dihedral_angle_d 15.221
    f_angle_d 1.201
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3169
    Nucleic Acid Atoms 0
    Heterogen Atoms 91
    Solvent Atoms 465
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection CBASS