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X-RAY DIFFRACTION
Materials and Methods page
4GE1
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 8.2
    Temperature 298.0
    Details 28-30% PEG 6000, 0.1 M Tris, pH 8.2, VAPOR DIFFUSION, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 69.26 α = 90
    b = 73.09 β = 91.45
    c = 80.93 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2008-04-12
     
    Diffraction Radiation
    Monochromator Si-111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 0.92309
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.15
    Resolution(Low) 50
    Number Reflections(All) 43654
    Number Reflections(Observed) 43654
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.076
    B(Isotropic) From Wilson Plot 40.4
    Redundancy 5.2
     
    High Resolution Shell Details
    Resolution(High) 2.15
    Resolution(Low) 2.19
    Percent Possible(All) 91.8
    R Merge I(Observed) 0.615
    Redundancy 4.6
    Number Unique Reflections(All) 2026
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 2.15
    Resolution(Low) 25.348
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 43654
    Number of Reflections(Observed) 43619
    Number of Reflections(R-Free) 2200
    Percent Reflections(Observed) 98.76
    R-Factor(Observed) 0.195
    R-Work 0.1921
    R-Free 0.2493
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 56.0103
    Anisotropic B[1][1] -8.2967
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -5.3411
    Anisotropic B[2][2] -4.573
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 12.8696
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.15
    Shell Resolution(Low) 2.1951
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2313
    R-Factor(R-Work) 0.2588
    R-Factor(R-Free) 0.333
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1951
    Shell Resolution(Low) 2.2461
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.263
    R-Factor(R-Free) 0.3294
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2461
    Shell Resolution(Low) 2.3023
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2646
    R-Factor(R-Free) 0.3628
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3023
    Shell Resolution(Low) 2.3645
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.3439
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3645
    Shell Resolution(Low) 2.434
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2496
    R-Factor(R-Free) 0.3253
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.434
    Shell Resolution(Low) 2.5125
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.2575
    R-Factor(R-Free) 0.324
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5125
    Shell Resolution(Low) 2.6022
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.2422
    R-Factor(R-Free) 0.3695
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6022
    Shell Resolution(Low) 2.7063
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.2387
    R-Factor(R-Free) 0.2935
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7063
    Shell Resolution(Low) 2.8293
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.2205
    R-Factor(R-Free) 0.3043
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8293
    Shell Resolution(Low) 2.9782
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.2258
    R-Factor(R-Free) 0.2984
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9782
    Shell Resolution(Low) 3.1645
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.2131
    R-Factor(R-Free) 0.306
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1645
    Shell Resolution(Low) 3.4083
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.2072
    R-Factor(R-Free) 0.2883
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4083
    Shell Resolution(Low) 3.7503
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1928
    R-Factor(R-Free) 0.2539
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7503
    Shell Resolution(Low) 4.2907
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.1916
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2907
    Shell Resolution(Low) 5.3973
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1346
    R-Factor(R-Free) 0.1844
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3973
    Shell Resolution(Low) 25.3498
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.1605
    R-Factor(R-Free) 0.1862
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.845
    f_plane_restr 0.003
    f_chiral_restr 0.073
    f_angle_d 0.903
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6183
    Nucleic Acid Atoms 0
    Heterogen Atoms 60
    Solvent Atoms 176
     
     
  •   Software and Computing Hide
    Computing
    Data Collection In house software
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution CCP4-FFT
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL