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X-RAY DIFFRACTION
Materials and Methods page
4GCX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 291.15
    Details 100 mM Tris, 1mM DTT, 10% DMSO, 12% PEG 8000, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 291.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.19 α = 90
    b = 65.05 β = 96.14
    c = 70.62 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 113.15
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details mirror
    Collection Date 2010-12-15
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.42
    Resolution(Low) 50
    Number Reflections(All) 76733
    Number Reflections(Observed) 76733
    Percent Possible(Observed) 99.0
    B(Isotropic) From Wilson Plot 10.23
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 1.42
    Resolution(Low) 1.44
    Percent Possible(All) 96.2
    Mean I Over Sigma(Observed) 2.2
    Redundancy 2.6
    Number Unique Reflections(All) 3750
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.42
    Resolution(Low) 24.732
    Cut-off Sigma(F) 1.0
    Number of Reflections(all) 73301
    Number of Reflections(Observed) 73301
    Number of Reflections(R-Free) 7398
    Percent Reflections(Observed) 94.59
    R-Factor(Observed) 0.1342
    R-Work 0.1312
    R-Free 0.1611
    R-Free Selection Details Random, 10 %
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic
    Anisotropic B[1][1] 1.4947
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.7991
    Anisotropic B[2][2] 0.683
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.1777
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.42
    Shell Resolution(Low) 1.4356
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 1890
    R-Factor(R-Work) 0.2492
    R-Factor(R-Free) 0.2679
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4356
    Shell Resolution(Low) 1.4525
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 1912
    R-Factor(R-Work) 0.2245
    R-Factor(R-Free) 0.2814
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4525
    Shell Resolution(Low) 1.4702
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 2011
    R-Factor(R-Work) 0.2053
    R-Factor(R-Free) 0.2467
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4702
    Shell Resolution(Low) 1.4888
    Number of Reflections(R-Free) 229
    Number of Reflections(R-Work) 2012
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2366
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4888
    Shell Resolution(Low) 1.5084
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 2112
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.2017
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5084
    Shell Resolution(Low) 1.5291
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2044
    R-Factor(R-Work) 0.1488
    R-Factor(R-Free) 0.2222
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5291
    Shell Resolution(Low) 1.5509
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 2162
    R-Factor(R-Work) 0.129
    R-Factor(R-Free) 0.1779
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5509
    Shell Resolution(Low) 1.5741
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 2114
    R-Factor(R-Work) 0.1168
    R-Factor(R-Free) 0.1685
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5741
    Shell Resolution(Low) 1.5987
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 2202
    R-Factor(R-Work) 0.1072
    R-Factor(R-Free) 0.1647
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5987
    Shell Resolution(Low) 1.6249
    Number of Reflections(R-Free) 240
    Number of Reflections(R-Work) 2159
    R-Factor(R-Work) 0.1032
    R-Factor(R-Free) 0.1524
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6249
    Shell Resolution(Low) 1.6529
    Number of Reflections(R-Free) 262
    Number of Reflections(R-Work) 2224
    R-Factor(R-Work) 0.1004
    R-Factor(R-Free) 0.1495
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6529
    Shell Resolution(Low) 1.6829
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 2224
    R-Factor(R-Work) 0.0975
    R-Factor(R-Free) 0.1399
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6829
    Shell Resolution(Low) 1.7153
    Number of Reflections(R-Free) 242
    Number of Reflections(R-Work) 2189
    R-Factor(R-Work) 0.0959
    R-Factor(R-Free) 0.1533
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7153
    Shell Resolution(Low) 1.7503
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 2204
    R-Factor(R-Work) 0.0921
    R-Factor(R-Free) 0.131
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7503
    Shell Resolution(Low) 1.7884
    Number of Reflections(R-Free) 253
    Number of Reflections(R-Work) 2217
    R-Factor(R-Work) 0.0958
    R-Factor(R-Free) 0.1367
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7884
    Shell Resolution(Low) 1.8299
    Number of Reflections(R-Free) 258
    Number of Reflections(R-Work) 2241
    R-Factor(R-Work) 0.0974
    R-Factor(R-Free) 0.1312
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8299
    Shell Resolution(Low) 1.8757
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 2253
    R-Factor(R-Work) 0.1044
    R-Factor(R-Free) 0.1419
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8757
    Shell Resolution(Low) 1.9264
    Number of Reflections(R-Free) 256
    Number of Reflections(R-Work) 2236
    R-Factor(R-Work) 0.114
    R-Factor(R-Free) 0.1478
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9264
    Shell Resolution(Low) 1.983
    Number of Reflections(R-Free) 264
    Number of Reflections(R-Work) 2236
    R-Factor(R-Work) 0.1174
    R-Factor(R-Free) 0.1655
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.983
    Shell Resolution(Low) 2.047
    Number of Reflections(R-Free) 285
    Number of Reflections(R-Work) 2284
    R-Factor(R-Work) 0.1166
    R-Factor(R-Free) 0.1576
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.047
    Shell Resolution(Low) 2.1201
    Number of Reflections(R-Free) 279
    Number of Reflections(R-Work) 2271
    R-Factor(R-Work) 0.1234
    R-Factor(R-Free) 0.1482
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1201
    Shell Resolution(Low) 2.205
    Number of Reflections(R-Free) 244
    Number of Reflections(R-Work) 2318
    R-Factor(R-Work) 0.1211
    R-Factor(R-Free) 0.1588
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.205
    Shell Resolution(Low) 2.3053
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 2324
    R-Factor(R-Work) 0.1202
    R-Factor(R-Free) 0.1475
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3053
    Shell Resolution(Low) 2.4267
    Number of Reflections(R-Free) 267
    Number of Reflections(R-Work) 2307
    R-Factor(R-Work) 0.119
    R-Factor(R-Free) 0.1486
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4267
    Shell Resolution(Low) 2.5786
    Number of Reflections(R-Free) 257
    Number of Reflections(R-Work) 2288
    R-Factor(R-Work) 0.1283
    R-Factor(R-Free) 0.1577
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5786
    Shell Resolution(Low) 2.7775
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 2341
    R-Factor(R-Work) 0.1323
    R-Factor(R-Free) 0.1609
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7775
    Shell Resolution(Low) 3.0565
    Number of Reflections(R-Free) 258
    Number of Reflections(R-Work) 2313
    R-Factor(R-Work) 0.1386
    R-Factor(R-Free) 0.1622
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0565
    Shell Resolution(Low) 3.4977
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 2348
    R-Factor(R-Work) 0.1346
    R-Factor(R-Free) 0.169
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4977
    Shell Resolution(Low) 4.4027
    Number of Reflections(R-Free) 259
    Number of Reflections(R-Work) 2282
    R-Factor(R-Work) 0.1352
    R-Factor(R-Free) 0.1425
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4027
    Shell Resolution(Low) 24.732
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 2185
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.1746
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.071
    f_dihedral_angle_d 12.265
    f_angle_d 1.108
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2843
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 397
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Phaser
    data collection MAR345dtb