POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4GC3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.6
    Temperature 293.0
    Details 25% PEG 4000, 0.1M sodium acetate, 0.2M ammonium sulfate, 0.5 mM Zinc Chloride, pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 51.48 α = 90
    b = 76.5 β = 90
    c = 78.06 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-07-17
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.32
    Resolution(Low) 39.03
    Number Reflections(All) 72355
    Number Reflections(Observed) 72355
    Percent Possible(Observed) 99.14
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.32
    Resolution(Low) 39.028
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 72355
    Number of Reflections(Observed) 72355
    Number of Reflections(R-Free) 3645
    Percent Reflections(Observed) 99.14
    R-Factor(All) 0.1523
    R-Factor(Observed) 0.1523
    R-Work 0.1518
    R-Free 0.162
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3205
    Shell Resolution(Low) 1.3378
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.2016
    R-Factor(R-Free) 0.2447
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3378
    Shell Resolution(Low) 1.3562
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.187
    R-Factor(R-Free) 0.2053
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3562
    Shell Resolution(Low) 1.3755
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.1774
    R-Factor(R-Free) 0.1985
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3755
    Shell Resolution(Low) 1.3961
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.1645
    R-Factor(R-Free) 0.1737
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3961
    Shell Resolution(Low) 1.4179
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.1627
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4179
    Shell Resolution(Low) 1.4411
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.1551
    R-Factor(R-Free) 0.1684
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4411
    Shell Resolution(Low) 1.466
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.1489
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.466
    Shell Resolution(Low) 1.4926
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1473
    R-Factor(R-Free) 0.1531
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4926
    Shell Resolution(Low) 1.5214
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.1451
    R-Factor(R-Free) 0.1688
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5214
    Shell Resolution(Low) 1.5524
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.1366
    R-Factor(R-Free) 0.1514
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5524
    Shell Resolution(Low) 1.5862
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.1399
    R-Factor(R-Free) 0.1642
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5862
    Shell Resolution(Low) 1.6231
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1417
    R-Factor(R-Free) 0.1555
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6231
    Shell Resolution(Low) 1.6637
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.134
    R-Factor(R-Free) 0.1507
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6637
    Shell Resolution(Low) 1.7086
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.1362
    R-Factor(R-Free) 0.1404
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7086
    Shell Resolution(Low) 1.7589
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.1417
    R-Factor(R-Free) 0.1759
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7589
    Shell Resolution(Low) 1.8157
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.1465
    R-Factor(R-Free) 0.1527
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8157
    Shell Resolution(Low) 1.8806
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.146
    R-Factor(R-Free) 0.1714
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8806
    Shell Resolution(Low) 1.9559
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2674
    R-Factor(R-Work) 0.149
    R-Factor(R-Free) 0.148
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9559
    Shell Resolution(Low) 2.0449
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1454
    R-Factor(R-Free) 0.1658
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0449
    Shell Resolution(Low) 2.1527
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1473
    R-Factor(R-Free) 0.1525
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1527
    Shell Resolution(Low) 2.2875
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.1677
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2875
    Shell Resolution(Low) 2.4641
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1579
    R-Factor(R-Free) 0.1811
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4641
    Shell Resolution(Low) 2.7121
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1636
    R-Factor(R-Free) 0.1735
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7121
    Shell Resolution(Low) 3.1044
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.1564
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1044
    Shell Resolution(Low) 3.9106
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.1469
    R-Factor(R-Free) 0.1512
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9106
    Shell Resolution(Low) 39.0455
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2843
    R-Factor(R-Work) 0.1514
    R-Factor(R-Free) 0.155
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 14.632
    f_angle_d 1.088
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2173
    Nucleic Acid Atoms 0
    Heterogen Atoms 18
    Solvent Atoms 422
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution balbes
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building balbes
    data collection CBASS