X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.3
Temperature 277.0
Details 35% Peg400, 0.2M MgCl2, 0.1M Na Hepes, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 141.12 α = 90
b = 141.12 β = 90
c = 42.81 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 270 -- 2011-08-15
Diffraction Radiation
Monochromator Protocol
Si (111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 0.9795 NSLS X6A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.18 24 99.9 0.076 0.076 -- 7.1 -- 999641 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.18 1.22 99.7 0.554 0.554 2.04 6.6 13937

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.179 21.037 -- 1.35 -- 141257 14125 99.71 -- 0.102 0.0999 0.121 random 10%
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.1795 1.1929 -- 463 4168 0.1708 0.2012 -- 99.0
X Ray Diffraction 1.1929 1.2069 -- 460 4146 0.1523 0.1943 -- 100.0
X Ray Diffraction 1.2069 1.2216 -- 470 4221 0.1421 0.1719 -- 100.0
X Ray Diffraction 1.2216 1.2371 -- 461 4144 0.1382 0.1666 -- 100.0
X Ray Diffraction 1.2371 1.2534 -- 467 4215 0.1358 0.1674 -- 100.0
X Ray Diffraction 1.2534 1.2705 -- 469 4217 0.137 0.1608 -- 100.0
X Ray Diffraction 1.2705 1.2887 -- 464 4170 0.1303 0.1542 -- 100.0
X Ray Diffraction 1.2887 1.3079 -- 469 4223 0.1199 0.1612 -- 100.0
X Ray Diffraction 1.3079 1.3284 -- 468 4210 0.1101 0.1482 -- 100.0
X Ray Diffraction 1.3284 1.3501 -- 466 4204 0.1017 0.1352 -- 100.0
X Ray Diffraction 1.3501 1.3734 -- 470 4222 0.0929 0.1278 -- 100.0
X Ray Diffraction 1.3734 1.3984 -- 467 4195 0.0907 0.1205 -- 100.0
X Ray Diffraction 1.3984 1.4253 -- 471 4243 0.0879 0.1276 -- 100.0
X Ray Diffraction 1.4253 1.4544 -- 466 4196 0.0861 0.1199 -- 100.0
X Ray Diffraction 1.4544 1.486 -- 470 4231 0.0887 0.1179 -- 100.0
X Ray Diffraction 1.486 1.5205 -- 471 4242 0.0768 0.1078 -- 100.0
X Ray Diffraction 1.5205 1.5585 -- 466 4192 0.0662 0.1039 -- 100.0
X Ray Diffraction 1.5585 1.6007 -- 473 4257 0.0662 0.0977 -- 100.0
X Ray Diffraction 1.6007 1.6478 -- 473 4256 0.0635 0.091 -- 100.0
X Ray Diffraction 1.6478 1.7009 -- 471 4236 0.0676 0.0931 -- 100.0
X Ray Diffraction 1.7009 1.7617 -- 469 4228 0.0702 0.0944 -- 100.0
X Ray Diffraction 1.7617 1.8322 -- 473 4256 0.0744 0.0989 -- 100.0
X Ray Diffraction 1.8322 1.9155 -- 475 4268 0.0771 0.11 -- 100.0
X Ray Diffraction 1.9155 2.0164 -- 473 4264 0.0806 0.1075 -- 100.0
X Ray Diffraction 2.0164 2.1426 -- 475 4288 0.0835 0.0982 -- 100.0
X Ray Diffraction 2.1426 2.3079 -- 474 4260 0.0828 0.1022 -- 100.0
X Ray Diffraction 2.3079 2.5398 -- 477 4300 0.092 0.1117 -- 99.0
X Ray Diffraction 2.5398 2.9065 -- 477 4290 0.1064 0.1216 -- 99.0
X Ray Diffraction 2.9065 3.6587 -- 483 4346 0.12 0.1271 -- 99.0
X Ray Diffraction 3.6587 21.0404 -- 494 4444 0.1382 0.14 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.01
f_chiral_restr 0.132
f_dihedral_angle_d 17.478
f_angle_d 1.475
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3167
Nucleic Acid Atoms 0
Heterogen Atoms 107
Solvent Atoms 658

Software

Computing
Computing Package Purpose
CBASS Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASER model building
CBASS data collection