X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 298.0
Details 10 mM Tris-HCl, 150 mM NaCl, 8mM CaCl2.2H2O and 3% PEG 8000, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 255.2 α = 90
b = 350.1 β = 90.12
c = 272.1 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 mirrors 2008-11-06
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.0895 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.2 40 61.3 -- 0.114 -- 1.7 782183 479478 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.2 3.31 58.3 -- 0.4 1.3 1.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 3.2 40.0 -- 0.0 -- 456306 22657 58.4 -- -- 0.2563 0.2592 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.2 3.31 -- 1939 36681 0.3821 0.3874 -- 49.5
X Ray Diffraction 3.31 3.45 -- 1995 38430 0.3481 0.3513 -- 51.8
X Ray Diffraction 3.45 3.6 -- 2100 40024 0.3196 0.3183 -- 54.0
X Ray Diffraction 3.6 3.79 -- 2231 42143 0.295 0.3018 -- 56.9
X Ray Diffraction 3.79 4.03 -- 2317 43840 0.2758 0.2763 -- 59.1
X Ray Diffraction 4.03 4.34 -- 2339 45173 0.2472 0.2481 -- 60.8
X Ray Diffraction 4.34 4.78 -- 2401 45958 0.2296 0.2313 -- 61.8
X Ray Diffraction 4.78 5.47 -- 2435 47782 0.2218 0.2331 -- 64.2
X Ray Diffraction 5.47 6.88 -- 2509 47995 0.2195 0.2232 -- 64.5
X Ray Diffraction 6.88 40.0 -- 2391 45623 0.2123 0.2103 -- 61.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 61.7723
Anisotropic B[1][1] 6.771
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -1.744
Anisotropic B[2][2] -16.134
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 9.363
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 2.706
c_mcangle_it 2.15
c_scbond_it 1.61
c_mcbond_it 1.186
c_angle_d 1.366
c_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4366
Nucleic Acid Atoms 0
Heterogen Atoms 2
Solvent Atoms 18

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
SCALEPACK Data Reduction (data scaling)
AMoRE Structure Solution
CNS 1.3 Structure Refinement
Software
Software Name Purpose
CNS version: 1.3 refinement
AMoRE model building
HKL-2000 data collection