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X-RAY DIFFRACTION
Materials and Methods page
4GBT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 298.0
    Details 10 mM Tris-HCl, 150 mM NaCl, 8mM CaCl2.2H2O and 3% PEG 8000, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 255.2 α = 90
    b = 350.1 β = 90.12
    c = 272.1 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details mirrors
    Collection Date 2008-11-06
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.0895
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.2
    Resolution(Low) 40
    Number Reflections(All) 782183
    Number Reflections(Observed) 479478
    Percent Possible(Observed) 61.3
    Redundancy 1.7
     
    High Resolution Shell Details
    Resolution(High) 3.2
    Resolution(Low) 3.31
    Percent Possible(All) 58.3
    Mean I Over Sigma(Observed) 1.3
    R-Sym I(Observed) 0.4
    Redundancy 1.5
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 3.2
    Resolution(Low) 40.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 456306
    Number of Reflections(R-Free) 22657
    Percent Reflections(Observed) 58.4
    R-Work 0.2563
    R-Free 0.2592
     
    Temperature Factor Modeling
    Mean Isotropic B Value 61.7723
    Anisotropic B[1][1] 6.771
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.744
    Anisotropic B[2][2] -16.134
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 9.363
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2
    Shell Resolution(Low) 3.31
    Number of Reflections(R-Free) 1939
    Number of Reflections(R-Work) 36681
    R-Factor(R-Work) 0.3821
    R-Factor(R-Free) 0.3874
    Percent Reflections(Observed) 49.5
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.31
    Shell Resolution(Low) 3.45
    Number of Reflections(R-Free) 1995
    Number of Reflections(R-Work) 38430
    R-Factor(R-Work) 0.3481
    R-Factor(R-Free) 0.3513
    Percent Reflections(Observed) 51.8
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.45
    Shell Resolution(Low) 3.6
    Number of Reflections(R-Free) 2100
    Number of Reflections(R-Work) 40024
    R-Factor(R-Work) 0.3196
    R-Factor(R-Free) 0.3183
    Percent Reflections(Observed) 54.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6
    Shell Resolution(Low) 3.79
    Number of Reflections(R-Free) 2231
    Number of Reflections(R-Work) 42143
    R-Factor(R-Work) 0.295
    R-Factor(R-Free) 0.3018
    Percent Reflections(Observed) 56.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.79
    Shell Resolution(Low) 4.03
    Number of Reflections(R-Free) 2317
    Number of Reflections(R-Work) 43840
    R-Factor(R-Work) 0.2758
    R-Factor(R-Free) 0.2763
    Percent Reflections(Observed) 59.1
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.03
    Shell Resolution(Low) 4.34
    Number of Reflections(R-Free) 2339
    Number of Reflections(R-Work) 45173
    R-Factor(R-Work) 0.2472
    R-Factor(R-Free) 0.2481
    Percent Reflections(Observed) 60.8
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.34
    Shell Resolution(Low) 4.78
    Number of Reflections(R-Free) 2401
    Number of Reflections(R-Work) 45958
    R-Factor(R-Work) 0.2296
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 61.8
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.78
    Shell Resolution(Low) 5.47
    Number of Reflections(R-Free) 2435
    Number of Reflections(R-Work) 47782
    R-Factor(R-Work) 0.2218
    R-Factor(R-Free) 0.2331
    Percent Reflections(Observed) 64.2
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.47
    Shell Resolution(Low) 6.88
    Number of Reflections(R-Free) 2509
    Number of Reflections(R-Work) 47995
    R-Factor(R-Work) 0.2195
    R-Factor(R-Free) 0.2232
    Percent Reflections(Observed) 64.5
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.88
    Shell Resolution(Low) 40.0
    Number of Reflections(R-Free) 2391
    Number of Reflections(R-Work) 45623
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.2103
    Percent Reflections(Observed) 61.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.706
    c_mcangle_it 2.15
    c_scbond_it 1.61
    c_mcbond_it 1.186
    c_angle_d 1.366
    c_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4366
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 18
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution AMoRE
    Structure Refinement CNS 1.3
     
    Software
    refinement CNS version: 1.3
    model building AMoRE
    data collection HKL-2000