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X-RAY DIFFRACTION
Materials and Methods page
4GAM
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 298.0
    Details 0.1 M MES and 15% PEG 20,000 (w/v) ure 298K, pH 6.5, VAPOR DIFFUSION, SITTING DROP
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 183.59 α = 90
    b = 248.97 β = 90
    c = 122.29 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2011-11-21
     
    Diffraction Radiation
    Monochromator Double crystal, Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.2
    Wavelength List 1.0
    Site ALS
    Beamline 8.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.9
    Resolution(Low) 50
    Number Reflections(All) 457504
    Number Reflections(Observed) 118133
    Percent Possible(Observed) 95.8
    B(Isotropic) From Wilson Plot 50.8
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 2.9
    Resolution(Low) 2.98
    Percent Possible(All) 93.5
    Mean I Over Sigma(Observed) 2.1
    R-Sym I(Observed) 0.537
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.902
    Resolution(Low) 50.0
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 118133
    Number of Reflections(Observed) 118084
    Number of Reflections(R-Free) 5918
    Percent Reflections(Observed) 95.03
    R-Factor(Observed) 0.2082
    R-Work 0.2055
    R-Free 0.2584
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -12.1402
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 9.0761
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -19.2864
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9024
    Shell Resolution(Low) 2.9354
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3418
    R-Factor(R-Work) 0.305
    R-Factor(R-Free) 0.3606
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9354
    Shell Resolution(Low) 2.9699
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3781
    R-Factor(R-Work) 0.2907
    R-Factor(R-Free) 0.331
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9699
    Shell Resolution(Low) 3.0061
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3754
    R-Factor(R-Work) 0.2813
    R-Factor(R-Free) 0.347
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0061
    Shell Resolution(Low) 3.0442
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 3772
    R-Factor(R-Work) 0.2785
    R-Factor(R-Free) 0.3503
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0442
    Shell Resolution(Low) 3.0843
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3780
    R-Factor(R-Work) 0.2706
    R-Factor(R-Free) 0.3337
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0843
    Shell Resolution(Low) 3.1265
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3802
    R-Factor(R-Work) 0.2675
    R-Factor(R-Free) 0.3495
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1265
    Shell Resolution(Low) 3.1712
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3759
    R-Factor(R-Work) 0.2622
    R-Factor(R-Free) 0.3192
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1712
    Shell Resolution(Low) 3.2185
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3823
    R-Factor(R-Work) 0.2509
    R-Factor(R-Free) 0.3607
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2185
    Shell Resolution(Low) 3.2688
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 3718
    R-Factor(R-Work) 0.2428
    R-Factor(R-Free) 0.2842
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2688
    Shell Resolution(Low) 3.3224
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3758
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.3439
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3224
    Shell Resolution(Low) 3.3797
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 3755
    R-Factor(R-Work) 0.2306
    R-Factor(R-Free) 0.2975
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3797
    Shell Resolution(Low) 3.4412
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3759
    R-Factor(R-Work) 0.2227
    R-Factor(R-Free) 0.2848
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4412
    Shell Resolution(Low) 3.5074
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3777
    R-Factor(R-Work) 0.2132
    R-Factor(R-Free) 0.2898
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5074
    Shell Resolution(Low) 3.579
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3741
    R-Factor(R-Work) 0.2008
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.579
    Shell Resolution(Low) 3.6568
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 3726
    R-Factor(R-Work) 0.1995
    R-Factor(R-Free) 0.26
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6568
    Shell Resolution(Low) 3.7419
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3758
    R-Factor(R-Work) 0.1985
    R-Factor(R-Free) 0.2569
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7419
    Shell Resolution(Low) 3.8354
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3754
    R-Factor(R-Work) 0.1928
    R-Factor(R-Free) 0.2367
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8354
    Shell Resolution(Low) 3.9391
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3730
    R-Factor(R-Work) 0.179
    R-Factor(R-Free) 0.2121
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9391
    Shell Resolution(Low) 4.0551
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3736
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0551
    Shell Resolution(Low) 4.186
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3748
    R-Factor(R-Work) 0.1659
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.186
    Shell Resolution(Low) 4.3356
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3729
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.2203
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3356
    Shell Resolution(Low) 4.5092
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3757
    R-Factor(R-Work) 0.1695
    R-Factor(R-Free) 0.2111
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5092
    Shell Resolution(Low) 4.7144
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 3720
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.215
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7144
    Shell Resolution(Low) 4.963
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3735
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.963
    Shell Resolution(Low) 5.2739
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3744
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2739
    Shell Resolution(Low) 5.6812
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3706
    R-Factor(R-Work) 0.1946
    R-Factor(R-Free) 0.2437
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6812
    Shell Resolution(Low) 6.2529
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3718
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.244
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2529
    Shell Resolution(Low) 7.1577
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3716
    R-Factor(R-Work) 0.2002
    R-Factor(R-Free) 0.2257
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.1577
    Shell Resolution(Low) 9.0178
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3736
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.1839
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.0178
    Shell Resolution(Low) 147.953
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3756
    R-Factor(R-Work) 0.1992
    R-Factor(R-Free) 0.2146
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.06
    f_dihedral_angle_d 15.622
    f_angle_d 0.862
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 39092
    Nucleic Acid Atoms 0
    Heterogen Atoms 8
    Solvent Atoms 45
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building Phaser
    data collection ADSC version: Quantum